Fernando Brizuela, Ph.D.
Affiliations: | 2010 | Colorado State University, Fort Collins, CO |
Area:
Electronics and Electrical Engineering, Optics PhysicsGoogle:
"Fernando Brizuela"Parents
Sign in to add mentorCarmen S. Menoni | grad student | 2010 | Colorado State | |
(Table-top, full-field, actinic microscope for Extreme Ultraviolet Lithography mask characterization.) |
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Publications
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Maclot S, Coudert-Alteirac H, Campi F, et al. (2015) Towards XUV-pump XUV-probe experiments with attosecond pulses at the Lund Laser Centre Journal of Physics: Conference Series. 635: 112079 |
Jarnac A, Brizuela F, Heyl CM, et al. (2014) Compression of TW class laser pulses in a planar hollow waveguide for applications in strong-field physics European Physical Journal D. 68 |
Brizuela F, Heyl CM, Rudawski P, et al. (2013) Efficient high-order harmonic generation boosted by below-threshold harmonics. Scientific Reports. 3: 1410 |
Carbajo S, Howlett ID, Brizuela F, et al. (2012) Sequential single-shot imaging of nanoscale dynamic interactions with a table-top soft x-ray laser. Optics Letters. 37: 2994-6 |
Carbajo S, Howlett ID, Brizuela F, et al. (2012) Sequential single-shot imaging of nanoscale dynamic interactions with a table-top soft x-ray laser Optics Letters. 37: 2994-2996 |
Brizuela F, Howlett ID, Carbajo S, et al. (2012) Imaging at the nanoscale with practical table-top euv laser-based full-field microscopes Ieee Journal On Selected Topics in Quantum Electronics. 18: 434-442 |
Howlett ID, Brizuela F, Carbajo S, et al. (2011) Assessment of illumination characteristics of soft x-ray laser-based full-field microscopes Proceedings of Spie - the International Society For Optical Engineering. 8140 |
Brizuela F, Carbajo S, Sakdinawat A, et al. (2010) Extreme ultraviolet laser-based table-top aerial image metrology of lithographic masks. Optics Express. 18: 14467-73 |
Carbajo S, Brizuela F, Sakdinawat A, et al. (2010) Movies At The Nanoscale Using Extreme Ultraviolet Laser Light Frontiers in Optics |
Carbajo S, Brizuela F, Martz DH, et al. (2010) Laser based aerial microscope for at-wavelength characterization of extreme ultraviolet lithography masks 2010 23rd Annual Meeting of the Ieee Photonics Society, Photinics 2010. 584-585 |