Mohamed I. Elmasry
Affiliations: | University of Waterloo, Waterloo, ON, Canada |
Area:
Electronics and Electrical EngineeringWebsite:
https://ece.uwaterloo.ca/~elmasry/Google:
"Mohamed I. Elmasry"Bio:
Parents
Sign in to add mentor| Ching Lai Sheng | grad student | 1974 | University of Ottawa | |
| Philip M. Thompson | grad student | 1974 | University of Ottawa | |
| (A modular design approach to large-scale-integration of high-speed digital systems.) | ||||
Children
Sign in to add trainee| Amr M. Fahim | grad student | 2001 | University of Waterloo |
| Nasser Masoumi | grad student | 2002 | University of Waterloo |
| Mohab H. Anis | grad student | 2003 | University of Waterloo |
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Publications
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| Mostafa H, Anis M, Elmasry M. (2013) Statistical SRAM read access yield improvement using negative capacitance circuits Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 21: 92-101 |
| Mostafa H, Anis M, Elmasry M. (2012) On-chip process variations compensation using an analog adaptive body bias (A-ABB) Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 20: 770-774 |
| Mostafa H, Anis M, Elmasry M. (2012) NBTI and process variations compensation circuits using adaptive body bias Ieee Transactions On Semiconductor Manufacturing. 25: 460-467 |
| Mostafa H, Anis M, Elmasry M. (2011) A bias-dependent model for the impact of process variations on the SRAM soft error immunity Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 19: 2130-2134 |
| Mostafa H, Anis M, Elmasry M. (2011) A novel low area overhead direct adaptive body bias (D-ABB) circuit for die-to-die and within-die variations compensation Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 19: 1848-1860 |
| Mostafa H, Anis MH, Elmasry M. (2011) Analytical soft error models accounting for die-to-die and within-die variations in sub-threshold SRAM cells Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 19: 182-195 |
| Mostafa H, Anis M, Elmasry M. (2011) Adaptive body bias for reducing the impacts of NBTI and process variations on 6T SRAM cells Ieee Transactions On Circuits and Systems I: Regular Papers. 58: 2859-2871 |
| Mostafa H, Anis M, Elmasry M. (2011) Novel timing yield improvement circuits for high-performance low-power wide fan-In dynamic or gates Ieee Transactions On Circuits and Systems I: Regular Papers. 58: 1785-1797 |
| Youssef A, Zahran M, Anis M, et al. (2010) On the power management of simultaneous multithreading processors Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 18: 1243-1248 |
| Mostafa H, Anis M, Elmasry M. (2010) A design-oriented soft error rate variation model accounting for both die-to-die and within-die variations in submicrometer CMOS SRAM cells Ieee Transactions On Circuits and Systems I: Regular Papers. 57: 1298-1311 |