Ravi M. Todi, Ph.D.

Affiliations: 
2007 University of Central Florida, Orlando, FL, United States 
Area:
Electronics and Electrical Engineering, Materials Science Engineering
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"Ravi Todi"

Parents

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Kalpathy B. Sundaram grad student 2007 University of Central Florida
 (Gate stack and channel engineering: Study of metal gates and germanium channel devices.)
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Publications

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Todi VO, Shantheyanda BP, Todi RM, et al. (2011) Optical characterization of BCN films deposited at various N2/Ar gas flow ratios by RF magnetron sputtering Materials Science and Engineering B-Advanced Functional Solid-State Materials. 176: 878-882
Savchyn O, Todi RM, Coffey KR, et al. (2010) High-temperature optical properties of sensitized Er3+ in Si-rich SiO2 – implications for gain performance Optical Materials. 32: 1274-1278
Savchyn O, Todi RM, Coffey KR, et al. (2009) Excitation wavelength independent sensitized Er3+ concentration in as-deposited and low temperature annealed Si-rich SiO2 films Applied Physics Letters. 95: 231109
Savchyn O, Todi RM, Coffey KR, et al. (2009) Observation of temperature-independent internal Er3+ relaxation efficiency in Si-rich SiO2 films Applied Physics Letters. 94: 241115
Vijayakumar A, Warren AP, Todi RM, et al. (2009) Photoluminescence from RF sputtered SiCBN thin films Journal of Materials Science: Materials in Electronics. 20: 144-148
Simoen E, Sonde S, Claeys C, et al. (2008) Processing Factors Impacting the Leakage Current and Flicker Noise of Germanium p + -n Junctions on Silicon Substrates Journal of the Electrochemical Society. 155
Warren AP, Todi RM, Yao B, et al. (2008) On the phase identification of dc magnetron sputtered Pt–Ru alloy thin films Journal of Vacuum Science and Technology. 26: 1208-1212
Savchyn O, Kik PG, Todi RM, et al. (2008) Effect of hydrogen passivation on luminescence-center-mediated Er excitation in Si-richSiO2with and without Si nanocrystals Physical Review B. 77
Savchyn O, Todi RM, Coffey KR, et al. (2008) Multilevel sensitization of Er3+ in low-temperature-annealed silicon-rich SiO2 Applied Physics Letters. 93: 233120
Vijayakumar A, Todi RM, Warren AP, et al. (2008) Influence of N2/Ar gas mixture ratio and annealing on optical properties of SiCBN thin films prepared by rf sputtering Diamond and Related Materials. 17: 944-948
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