Peter E. Raad
Affiliations: | Southern Methodist University, Dallas, TX, United States |
Area:
Mechanical EngineeringWebsite:
https://www.smu.edu/Lyle/Academics/Departments/ME/People/Faculty/RaadPeterGoogle:
"Peter Raad"Bio:
https://ieeexplore.ieee.org/author/37270885800
https://www.smu.edu/News/2014/peter-raad-engineering-medal-20nov2014
https://www.researchgate.net/profile/Peter-Raad-2
https://ui.adsabs.harvard.edu/abs/1986PhDT........32R/abstract
DOI: 10.1115/1.3269456
Parents
Sign in to add mentor| James Webb White | grad student | 1986 | University of Tennessee, Knoxville | |
| (A mapped finite difference study of noise transmission in nonuniform ducts) | ||||
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Publications
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| Bremer J, Chen DY, Malko A, et al. (2020) Electric-Based Thermal Characterization of GaN Technologies Affected by Trapping Effects Ieee Transactions On Electron Devices. 67: 1952-1958 |
| Tadjer MJ, Anderson TJ, Ancona MG, et al. (2019) GaN-On-Diamond HEMT Technology With TAVG = 176°C at PDC,max = 56 W/mm Measured by Transient Thermoreflectance Imaging Ieee Electron Device Letters. 40: 881-884 |
| Lee T, Burzo MG, Komarov PL, et al. (2011) Direct Observation of Heat Transport in Plural AlN Films Using Thermal Imaging and Transient Thermal Reflectance Method Electrochemical and Solid State Letters. 14 |
| Farzaneh M, Maize K, Lüeren D, et al. (2009) CCD-based thermoreflectance microscopy: Principles and applications Journal of Physics D: Applied Physics. 42 |
| Raad PE, Komarov PL, Burzo MG. (2008) Thermal characterization of embedded electronic features by an integrated system of CCD thermography and self-adaptive numerical modeling Microelectronics Journal. 39: 1008-1015 |
| Raad PE, Komarov PL, Burzo MG. (2007) An Integrated Experimental and Computational System for the Thermal Characterization of Complex Three-Dimensional Submicron Electronic Devices Ieee Transactions On Components and Packaging Technologies. 30: 597-603 |
| Burzo MG, Komarov PL, Raad PE. (2005) Noncontact transient temperature mapping of active electronic devices using the thermoreflectance method Ieee Transactions On Components and Packaging Technologies. 28: 637-643 |
| Burzo MG, Komarov PL, Raad PE. (2005) Minimizing the uncertainties associated with the measurement of thermal properties by the Transient thermo-reflectance method Ieee Transactions On Components and Packaging Technologies. 28: 39-44 |
| Raad PE, Bidoae R. (2005) The three-dimensional Eulerian-Lagrangian marker and micro cell method for the simulation of free surface flows Journal of Computational Physics. 203: 668-699 |
| Krueger PS, Bidoae R, Raad PE. (2004) Simulation of air entrapment by a plunging liquid jet of finite length Proceedings of the Asme Heat Transfer/Fluids Engineering Summer Conference 2004, Ht/Fed 2004. 1: 851-859 |