Wojciech Maly
Affiliations: | Electrical and Computer Engineering | Carnegie Mellon University, Pittsburgh, PA |
Area:
Electronics and Electrical EngineeringWebsite:
https://www.ece.cmu.edu/directory/bios/maly-wojciech.htmlGoogle:
"Wojciech Maly"Bio:
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Publications
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| Nag PK, Gattiker A, Wei S, et al. (2002) Modeling the economics of testing: A DFT perspective Ieee Design and Test of Computers. 19: 29-41 |
| Maly W. (2001) The design and test cost problem Ieee Design & Test of Computers. 18: 6-6 |
| Huber M, Nirschl T, Gstöttner J, et al. (2000) Yield and reliability analysis of digital standard cells with resistive defects Microelectronics Reliability. 40: 1635-1640 |
| Niewczas M, Maly W, Strojwas A. (1999) An algorithm for determining repetitive patterns in very large IC layouts Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 18: 494-501 |
| El-Maleh A, Marchok TE, Rajski J, et al. (1997) Behavior and testability preservation under the retiming transformation Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 16: 528-543 |
| Marchok TE, El-Maleh A, Maly W, et al. (1996) A complexity analysis of sequential ATPG Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 15: 1409-1423 |
| Khare JB, Maly W, Griep S, et al. (1995) Yield-oriented computer-aided defect diagnosis Ieee Transactions On Semiconductor Manufacturing. 8: 195-206 |
| Marchok TE, El-Maleh A, Rajski J, et al. (1995) Testability Implications of Performance-Driven Logic Synthesis Ieee Design and Test of Computers. 12: 32-39 |
| Schmitt-Landsiedel D, Keitel-Schulz D, Khare J, et al. (1995) Critical area analysis for design-based yield improvement of VLSI circuits Quality and Reliability Engineering International. 11: 227-232 |
| Khare JB, Maly W, Thomas ME. (1994) Extraction of defect size distributions in an IC layer using test structure data Ieee Transactions On Semiconductor Manufacturing. 7: 354-368 |