Fan-Chi ( Hou, Ph.D.
Affiliations: | 2002 | University of Florida, Gainesville, Gainesville, FL, United States |
Area:
Electronics and Electrical EngineeringGoogle:
"Fan-Chi Hou"Parents
Sign in to add mentor| Gijs Bosman | grad student | 2002 | UF Gainesville | |
| (Low-frequency bulk and surface generation -recombination noise simulations of semiconductor devices.) | ||||
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Publications
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| Hou F, Bosman G, Law ME. (2003) Simulation of oxide trapping noise in submicron n-channel MOSFETs Ieee Transactions On Electron Devices. 50: 846-852 |
| Hou F, Bosman G, Law ME. (2002) Maximum allowable bulk defect density for generation-recombination noise-free device operation Ieee Transactions On Electron Devices. 49: 2080-2082 |
| Hou F, Bosman G, Law ME. (2000) Characterization of generation–recombination noise using a physics-based device noise simulator Microelectronics Reliability. 40: 1883-1886 |
| Hou F, Bosman G, Simoen E, et al. (1998) Bulk defect induced low-frequency noise in n/sup +/-p silicon diodes Ieee Transactions On Electron Devices. 45: 2528-2536 |