Jinwoo Hwang, Ph.D.
Affiliations: | 2011 | University of Wisconsin, Madison, Madison, WI |
Area:
Materials Science EngineeringGoogle:
"Jinwoo Hwang"Parents
Sign in to add mentor| Paul M. Voyles | grad student | 2011 | UW Madison | |
| (Nanometer scale atomic structure of zirconium based bulk metallic glass.) | ||||
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Publications
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| Zhu T, O’Hara DJ, Noesges BA, et al. (2020) Coherent growth and characterization of van der Waals 1T−VSe2 layers on GaAs(111)B using molecular beam epitaxy Physical Review Materials. 4 |
| Bhuiyan AFMAU, Feng Z, Johnson JM, et al. (2020) Phase transformation in MOCVD growth of (AlxGa1−x)2O3 thin films Apl Materials. 8: 031104 |
| Karim R, Jayatunga BHD, Zhu M, et al. (2020) Effects of cation stoichiometry on surface morphology and crystallinity of ZnGeN2 films grown on GaN by metalorganic chemical vapor deposition Aip Advances. 10: 65302 |
| Im S, Zhao P, Yoo G, et al. (2020) Determining Medium Range Atomic Ordering in Metallic Glasses Using 4D-STEM Microscopy and Microanalysis. 1-3 |
| Johnson JM, Chen Z, Varley JB, et al. (2019) Unusual Formation of Point-Defect Complexes in the Ultrawide-Band-Gap Semiconductor β−Ga2O3 Physical Review X. 9 |
| Anhar Uddin Bhuiyan AFM, Feng Z, Johnson JM, et al. (2019) MOCVD epitaxy of β-(AlxGa1−x)2O3 thin films on (010) Ga2O3 substrates and N-type doping Applied Physics Letters. 115: 120602 |
| Mazumder B, Sarker J, Zhang Y, et al. (2019) Atomic scale investigation of chemical heterogeneity in β-(AlxGa1−x)2O3 films using atom probe tomography Applied Physics Letters. 115: 132105 |
| Lee T, Zhu M, Dittrich T, et al. (2019) Microstructural Investigation of the Impact Weld Interface of Pseudo Single Grained Cu and Ag Metallurgical and Materials Transactions A. 51: 558-561 |
| Im S, Chen Z, Johnson JM, et al. (2018) Direct determination of structural heterogeneity in metallic glasses using four-dimensional scanning transmission electron microscopy. Ultramicroscopy. 195: 189-193 |
| Souri M, Terzic J, Johnson JM, et al. (2018) Electronic and optical properties of La-doped Sr3Ir2O7 epitaxial thin films Physical Review Materials. 2 |