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Michel Tollenaere

Affiliations: 
Univ Grenoble Alpes 
Area:
Control plan, Model driven engineering, Generic Product, Semiconductor industry, DFM (Design for manufacturing), MFD (Manufacturing for Design), Ontology Engineering, Quality, Low volume manufacturing, Transformation
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Children

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Damien Constant grad student 1996 Université Joseph Fourier (Grenoble)
Lilia Gzara grad student 2000 INP GRENOBLE
Bruno Agard grad student 2002 Institut National Polytechnique de Grenoble (INPG) (MathTree)
Sébastien Menand grad student 2002 Grenoble, INPG
Christian Frank grad student 2003 Grenoble, INPG
Arnaud Rivière grad student 2004 Grenoble, INPG
Hendrik Busch grad student 2006 Grenoble, INPG
Roxane Lopez grad student 2006 Grenoble, INPG
Maher Aidi grad student 2007 Grenoble, INPG
Alaeddine Zouari grad student 2007 Grenoble, INPG
Aymen Mili grad student 2009 Grenoble, INPG
Seyed Hamedreza Izadpanah grad student 2011 Grenoble University
Belgacem Bettayeb grad student 2012 Grenoble University
Valérie Fiegenwald grad student 2012 Grenoble University
Muhammad Kashif Shahzad grad student 2012 Grenoble University
Onur Yildiz grad student 2015 Univ Grenoble Alpes
Anis Ben Said grad student 2016 Univ Grenoble Alpes

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Publications

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Shahzad M, Jimenez CC, Said AB, et al. (2016) Towards quantified measures of Agility for Production Line Information Systems (PLIS) Ifac-Papersonline. 49: 562-567
Said AB, Shahzad MK, Zamaï É, et al. (2016) Towards proactive maintenance actions scheduling in the Semiconductor Industry (SI) using Bayesian approach Ifac-Papersonline. 49: 544-549
Sahnoun M, Bettayeb B, Bassetto S, et al. (2016) Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing Journal of Intelligent Manufacturing. 27: 1335-1349
Said AB, Shahzad MK, Zamai E, et al. (2016) Experts' knowledge renewal and maintenance actions effectiveness in high-mix low-volume industries, using Bayesian approach Cognition, Technology & Work. 18: 193-213
Fiegenwald V, Bassetto S, Tollenaere M. (2014) Controlling non-conformities propagation in manufacturing International Journal of Production Research. 52: 4118-4131
Bettayeb B, Bassetto S, Vialletelle P, et al. (2012) Quality and exposure control in semiconductor manufacturing. Part II: Evaluation International Journal of Production Research. 50: 6852-6869
Bettayeb B, Bassetto S, Vialletelle P, et al. (2012) Quality and exposure control in semiconductor manufacturing. Part I: Modelling International Journal of Production Research. 50: 6835-6851
Bassetto S, Siadat A, Tollenaere M. (2011) The management of process control deployment using interactions in risks analyses Journal of Loss Prevention in the Process Industries. 24: 458-465
Mili A, Bassetto S, Siadat A, et al. (2009) Dynamic risk management unveil productivity improvements Journal of Loss Prevention in the Process Industries. 22: 25-34
Jose A, Tollenaere M. (2005) Modular and platform methods for product family design: literature analysis Journal of Intelligent Manufacturing. 16: 371-390
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