Herbert H. Sawin
Affiliations: | 1980 | Chemical Engineering | University of California, Berkeley, Berkeley, CA, United States |
1984- | Chemical Engineering | Massachusetts Institute of Technology, Cambridge, MA, United States |
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"Herbert Sawin"Parents
Sign in to add mentorRobert P. Merrill | grad student | 1980 | UC Berkeley (Chemistry Tree) | |
(A KINETIC STUDY OF HYDRAZINE DECOMPOSITION ON IRIDIUM(111) BY MOLECULAR BEAM SCATTERING AND TEMPERATURE PROGRAMMED DECOMPOSITION) |
Children
Sign in to add traineeOhseung Kwon | grad student | MIT | |
Brian Eric Thompson | grad student | 1986 | MIT |
Jane P. Chang | grad student | 1997 | MIT |
Heeyeop Chae | grad student | 2000 | MIT |
Stacy A Rasgon | grad student | 1999-2005 | MIT |
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Publications
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Antonelli GA, Jiang G, Sriram M, et al. (2010) Designing ultra-low-k dielectric materials for ease of patterning Materials Research Society Symposium Proceedings. 1249: 217-222 |
Guo W, Sawin HH. (2010) Etching of SiO2 in C4F8∕Ar plasmas. II. Simulation of surface roughening and local polymerization Journal of Vacuum Science and Technology. 28: 259-270 |
Guo W, Sawin HH. (2010) Etching of SiO2 in C4F8∕Ar plasmas. I. Numeric kinetics modeling and Monte Carlo simulation in a three-dimensional profile simulator Journal of Vacuum Science and Technology. 28: 250-258 |
Guo W, Sawin HH. (2009) Modeling of the angular dependence of plasma etching Journal of Vacuum Science and Technology. 27: 1326-1336 |
Guo W, Bai B, Sawin HH. (2009) Mixing-layer kinetics model for plasma etching and the cellular realization in three-dimensional profile simulator Journal of Vacuum Science and Technology. 27: 388-403 |
Guo W, Sawin HH. (2009) Review of profile and roughening simulation in microelectronics plasma etching Journal of Physics D. 42: 194014 |
Yin Y, Sawin HH. (2008) Angular etching yields of polysilicon and dielectric materials in Cl2∕Ar and fluorocarbon plasmas Journal of Vacuum Science and Technology. 26: 161-173 |
Yin Y, Sawin HH. (2008) Surface roughening of silicon, thermal silicon dioxide, and low-k dielectric coral films in argon plasma Journal of Vacuum Science and Technology. 26: 151-160 |
Yin Y, Sawin HH. (2007) Impact of etching kinetics on the roughening of thermal SiO2 and low-k dielectric coral films in fluorocarbon plasmas Journal of Vacuum Science and Technology. 25: 802-811 |
Kwon O, Sawin HH. (2006) Postsilicon oxide etch cleaning process using integrated ashing and an HF vapor process Journal of the Electrochemical Society. 153 |