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David E. Mease, Ph.D.

Affiliations: 
2003 University of Michigan, Ann Arbor, Ann Arbor, MI 
Area:
Statistics
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Vijayan N. Nair grad student 2003 University of Michigan
 (Contributions to engineering statistics: X -testing for reliability and optimal partitioning strategies.)

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Publications

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Mease D, Nair VN. (2006) Extreme (X-) testing with binary data and applications to reliability demonstration Technometrics. 48: 399-410
Mease D, Bingham D. (2006) Latin hyperrectangle sampling for computer experiments Technometrics. 48: 467-477
Mease D, Nair VN, Sudjianto A. (2004) Selective assembly in manufacturing: Statistical issues and optimal binning strategies Technometrics. 46: 165-175
Mease D. (2003) A Penalized Maximum Likelihood Approach for the Ranking of College Football Teams Independent of Victory Margins The American Statistician. 57: 241-248
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