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James E. Ivey, Ph.D.

Affiliations: 
2009 University of South Florida, Tampa, FL, United States 
Area:
Physical Oceanography, Remote Sensing
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"James Ivey"
Mean distance: 3388
 
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Kendall L. Carder grad student 2009 University of South Florida
 (Closure between apparent and inherent optical properties of the ocean with applications to the determination of spectral bottom reflectance.)

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Publications

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Corcoran AA, Wolny J, Leone E, et al. (2017) Drivers of phytoplankton dynamics in old Tampa Bay, FL (USA), a subestuary lagging in ecosystem recovery Estuarine Coastal and Shelf Science. 185: 130-140
Millie DF, Weckman GR, Young WA, et al. (2013) Coastal 'Big Data' and nature-inspired computation: Prediction potentials, uncertainties, and knowledge derivation of neural networks for an algal metric Estuarine, Coastal and Shelf Science. 125: 57-67
Millie DF, Weckman GR, Young WA, et al. (2012) Modeling microalgal abundance with artificial neural networks: Demonstration of a heuristic 'Grey-Box' to deconvolve and quantify environmental influences Environmental Modelling and Software. 38: 27-39
Liu CC, Miller RL, Carder KL, et al. (2006) Estimating the underwater light field from remote sensing of ocean color Journal of Oceanography. 62: 235-248
Otis DB, Carder KL, English DC, et al. (2004) CDOM transport from the Bahamas Banks Coral Reefs. 23: 152-160
Voss KJ, Mobley CD, Sundman LK, et al. (2003) The spectral upwelling radiance distribution in optically shallow waters Limnology and Oceanography. 48: 364-373
Carder KL, Liu CC, Lee Z, et al. (2003) Illumination and turbidity effects on observing faceted bottom elements with uniform Lambertian albedos Limnology and Oceanography. 48: 355-363
Liu CC, Carder KL, Miller RL, et al. (2002) Fast and accurate model of underwater scalar irradiance. Applied Optics. 41: 4962-74
Lohrenz SE, Redalje DG, Matulewski KM, et al. (1997) Comparison of measured inherent optical properties with estimates determined from reflectance in coastal waters off Cape Hatteras, North Carolina, USA Proceedings of Spie - the International Society For Optical Engineering. 2963: 489-494
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