Mustafa B. Yelten, Ph.D.
Affiliations: | 2011 | North Carolina State University, Raleigh, NC |
Area:
Electronics and Electrical Engineering, Nanotechnology, Computer EngineeringGoogle:
"Mustafa Yelten"Mean distance: 1330.95
Parents
Sign in to add mentorMichael B. Steer | grad student | 2011 | NCSU | |
(Variability and Reliability in Nanoscale Circuits: Simulation, Design, Monitoring, and Characterization.) |
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Publications
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Caglar A, Yelten MB. (2020) A 180-nm X -Band Cryogenic CMOS LNA Ieee Microwave and Wireless Components Letters. 30: 395-398 |
Güney A, Yelten MB, Ferhanoğlu O, et al. (2020) Experimental and modeling studies of automotive-qualified OLEDs under electrical stress Microelectronics Reliability. 111: 113704 |
Erol D, Güngördü AD, Dündar G, et al. (2020) A switchable DC offset cancellation circuit for time-based degradation correction Analog Integrated Circuits and Signal Processing. 1-7 |
Gencer FB, Xhafa X, İnam BB, et al. (2020) Design and validation of an artificial neural network based on analog circuits Analog Integrated Circuits and Signal Processing. 1-9 |
Xhafa X, Yelten MB. (2020) Design of a tunable LNA and its variability analysis through surrogate modeling International Journal of Numerical Modelling-Electronic Networks Devices and Fields |
Afacan E, Dündar G, Başkaya F, et al. (2019) On Chip Reconfigurable CMOS Analog Circuit Design and Automation Against Aging Phenomena: Sense and React Acm Transactions On Design Automation of Electronic Systems. 24: 1-22 |
Ilik S, Kabaoglu A, Solmaz NS, et al. (2019) Modeling of Total Ionizing Dose Degradation on 180-nm n-MOSFETs Using BSIM3 Ieee Transactions On Electron Devices. 66: 4617-4622 |
Kabaoglu A, Solmaz NS, Ilik S, et al. (2019) Statistical MOSFET Modeling Methodology for Cryogenic Conditions Ieee Transactions On Electron Devices. 66: 66-72 |
Caglar A, Yelten MB. (2019) Design of Cryogenic LNAs for High Linearity in Space Applications Ieee Transactions On Circuits and Systems I-Regular Papers. 66: 4619-4627 |
Kabaoğlu A, Şahin-Solmaz N, İlik S, et al. (2019) Variability-aware cryogenic models of mosfets: validation and circuit design Semiconductor Science and Technology. 34: 115004 |