Francisco J. Bezares, Ph.D.
Affiliations: | 2010 | Physics | Temple University, Philadelphia, PA, United States |
Area:
Condensed Matter Physics, Optics PhysicsGoogle:
"Francisco Bezares"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| Zameer U. Hasan | grad student | 2010 | Temple University | |
| (Pulsed laser deposition of europium-doped multilayer thin films for spectral storage applications.) | ||||
| Frank Koppens | post-doc | ICFO-The Institute of Photonic Sciences | ||
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Publications
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| Bezares FJ, De Sanctis A, Saavedra JRM, et al. (2017) Intrinsic plasmon-phonon interactions in highly-doped graphene: A near-field imaging study. Nano Letters |
| De Sanctis A, Jones GF, Wehenkel DJ, et al. (2017) Extraordinary linear dynamic range in laser-defined functionalized graphene photodetectors. Science Advances. 3: e1602617 |
| Lock EH, Hernández SC, Anderson TJ, et al. (2014) Etch free graphene transfer to polymers Surface and Coatings Technology. 241: 118-122 |
| Hernández SC, Bezares FJ, Robinson JT, et al. (2013) Controlling the local chemical reactivity of graphene through spatial functionalization Carbon. 60: 84-93 |
| Nyakiti LO, Myers-Ward RL, Wheeler VD, et al. (2012) Bilayer graphene grown on 4H-SiC (0001) step-free mesas. Nano Letters. 12: 1749-56 |
| Anderson TJ, Hobart KD, Nyakiti LO, et al. (2012) Electrical characterization of the graphene-SiC heterojunction Materials Science Forum. 717: 641-644 |
| Anderson TJ, Hobart KD, Nyakiti LO, et al. (2012) Investigation of the epitaxial graphene/p-SiC heterojunction Ieee Electron Device Letters. 33: 1610-1612 |
| Bezares F, Aly MF, Hasan Z. (2011) Atomic tailoring of Eu-centers in thinfilms for spectral storage applications Proceedings of Spie - the International Society For Optical Engineering. 7948 |
| Currie M, Caldwell JD, Bezares FJ, et al. (2011) Quantifying pulsed laser induced damage to graphene Applied Physics Letters. 99 |
| Hasan Z, Adamczyk A, Konjhodzic A, et al. (2005) Tailoring of nano-structures doped with optically active rare earth ions for single atom spectroscopy Proceedings of Spie - the International Society For Optical Engineering. 5842: 265-271 |