Samuel Berweger, Ph.D.
Affiliations: | 2011 | University of Washington, Seattle, Seattle, WA |
Area:
Physical Chemistry, Condensed Matter PhysicsGoogle:
"Samuel Berweger"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| Markus B. Raschke | grad student | 2011 | University of Washington | |
| (Plasmonic Antennas for Optical Nanocrystallography and Femtosecond Spatio-Temporal Control.) | ||||
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Publications
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| Berweger S, Blanchard PT, Brubaker MD, et al. (2024) Near-Field Control and Imaging of Free Charge Carrier Variations in GaN Nanowires. Applied Physics Letters. 108 |
| Berweger S, Zhang H, Sahoo PK, et al. (2020) Spatially Resolved Persistent Photoconductivity in MoS-WS Lateral Heterostructures. Acs Nano |
| Brubaker M, Roshko A, Berweger S, et al. (2020) Crystallographic Polarity Measurements in Two-Terminal GaN Nanowire Devices by Lateral Piezoresponse Force Microscopy. Nanotechnology |
| Berweger S, Wallis TM, Kabos P. (2020) Nanoelectronic Characterization: Using Near-Field Microwave Microscopy for Nanotechnological Research Ieee Microwave Magazine. 21: 36-51 |
| Berweger S, Qiu G, Wang YX, et al. (2019) Imaging Carrier Inhomogeneities in Ambipolar Tellurene Field Effect Transistors. Nano Letters |
| Coakley KJ, Berweger S, Wallis TM, et al. (2019) Disentangling topographic contributions to near-field scanning microwave microscopy images. Ultramicroscopy. 197: 53-64 |
| Berweger S, Weber JC, John J, et al. (2015) Microwave near-field imaging of two-dimensional semiconductors. Nano Letters. 15: 1122-7 |
| Coakley KJ, Imtiaz A, Wallis TM, et al. (2015) Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images. Ultramicroscopy. 150: 1-9 |
| Shi Z, Bechtel HA, Berweger S, et al. (2015) Amplitude- and Phase-Resolved Nanospectral Imaging of Phonon Polaritons in Hexagonal Boron Nitride Acs Photonics. 2: 790-796 |
| Weber JC, Blanchard PT, Sanders AW, et al. (2014) GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. Nanotechnology. 25: 415502 |