Jonathan F. Lind, Ph.D.

Affiliations: 
2013 Physics Carnegie Mellon University, Pittsburgh, PA 
Area:
Condensed Matter Physics, Materials Science Engineering
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Robert M. Suter grad student 2013 Carnegie Mellon
 (In-situ High-Energy Diffraction Microscopy Study of Zirconium Under Uni-axial Tensile Deformation.)
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Publications

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Bhattacharya A, Shen YF, Hefferan CM, et al. (2021) Grain boundary velocity and curvature are not correlated in Ni polycrystals. Science (New York, N.Y.). 374: 189-193
Lind J, Robinson AK, Kumar M. (2020) Insight into the coordinated jetting behavior in periodic lattice structures under dynamic compression Journal of Applied Physics. 128: 15901
Lind J, Jensen BJ, Barham M, et al. (2019) In situ dynamic compression wave behavior in additively manufactured lattice materials Journal of Materials Research. 34: 2-19
Crum RS, Homel MA, Pagan DC, et al. (2019) In situ X-ray imaging of heterogeneity in dynamic compaction of granular media Journal of Applied Physics. 125: 025902
Kelly JP, Nguyen JH, Lind J, et al. (2019) Application of Al-Cu-W-Ta graded density impactors in dynamic ramp compression experiments Journal of Applied Physics. 125: 145902
Bhattacharya A, Shen Y, Hefferan CM, et al. (2019) Three-dimensional observations of grain volume changes during annealing of polycrystalline Ni Acta Materialia. 167: 40-50
Miller DJ, Crum RS, Homel MA, et al. (2019) Correction to: Hugoniot Measurements Utilizing In Situ Synchrotron X-ray Radiation Journal of Dynamic Behavior of Materials. 5: 194-194
Miller DJ, Crum RS, Homel MA, et al. (2019) Hugoniot Measurements Utilizing In Situ Synchrotron X-ray Radiation Journal of Dynamic Behavior of Materials. 5: 93-104
Hanson JP, Bagri A, Lind J, et al. (2018) Crystallographic character of grain boundaries resistant to hydrogen-assisted fracture in Ni-base alloy 725. Nature Communications. 9: 3386
Plumb JC, Lind JF, Tucker JC, et al. (2018) Three-dimensional grain mapping of open-cell metallic foam by integrating synthetic data with experimental data from high-energy X-ray diffraction microscopy Materials Characterization. 144: 448-460
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