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D. Mark Riffe

Affiliations: 
Physics Utah State University, Logan, UT, United States 
Area:
Ultrafast spectroscopy, Surface physics, Core-level photoemission
Website:
http://www.physics.usu.edu/fachtmnj/dmr.htm
Google:
"David Mark Riffe"
Bio:

http://www.weber.edu/wsuimages/Assessment/ProgramReview/Physics/physics_ss0708.pdf

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Parents

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Albert J. Sievers grad student 1989 Cornell
 (Adsorbates on W(100) : vibrational and electronic response in the IR.)
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Publications

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Chauhan KN, Riffe DM, Everett EA, et al. (2013) Carrier capture dynamics of single InGaAs/GaAs quantum-dot layers Journal of Applied Physics. 113
Riffe DM, Sabbah AJ. (2007) Coherent excitation of the optic phonon in Si: Transiently stimulated Raman scattering with a finite-lifetime electronic excitation Physical Review B - Condensed Matter and Materials Physics. 76
Riffe DM, Sabbah AJ. (2005) Carrier and coherent lattice dynamics of Si probed with ultrafast spectroscopy Aip Conference Proceedings. 772: 1226-1227
Sabbah AJ, Riffe DM. (2002) Femtosecond pump-probe reflectivity study of silicon carrier dynamics Physical Review B - Condensed Matter and Materials Physics. 66: 1652171-16521711
Sabbah AJ, Riffe DM. (2000) Measurement of silicon surface recombination velocity using ultrafast pump-probe reflectivity in the near infrared Journal of Applied Physics. 88: 6954-6956
Riffe DM, Sabbah AJ. (1998) A compact rotating-mirror autocorrelator design for femtosecond and picosecond laser pulses Review of Scientific Instruments. 69: 3099-3102
Riffe DM, Sievers AJ. (1993) CO layers on W(100) by infrared spectroscopy Surface Science. 297: 1-10
Riffe DM, Sievers AJ. (1990) Hydrogen adsorption on the beta -N-covered W(100) surface: An infrared study of the W-H stretch. Physical Review. B, Condensed Matter. 41: 3406-3425
Riffe DM, Sievers AJ. (1990) Hydrogen adsorption on the -N-covered W(100) surface: An infrared study of the W-H stretch Physical Review B. 41: 3406-3425
Riffe DM, Sievers AJ. (1989) Infrared reflection-adsorption spectroscopy of W(100)-H at 100 K Surface Science. 210: L215-L222
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