Jack L. Glover

Affiliations: 
University of Melbourne, Parkville, Victoria, Australia 
Area:
x-ray imaging, x-ray attenuation
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"Jack Glover"
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Publications

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Gupta P, Sinno Z, Glover JL, et al. (2019) Predicting detection performance on security X-ray images as a function of image quality. Ieee Transactions On Image Processing : a Publication of the Ieee Signal Processing Society
Glover JL, Tosh RE, Hudson LT, et al. (2018) Testing the Image Quality of Cabinet X-ray Systems for Security Screening: The Revised ASTM F792 Standard. Journal of Testing and Evaluation. 46
Glover JL, Hudson LT, Paulter NG. (2018) Improved Threat Identification Using Tonemapping of High-Dynamic-Range X-ray Images. Journal of Testing and Evaluation. 46
Gupta P, Glover JL, Paulter NG, et al. (2018) Studying the Statistics of Natural X-ray Pictures Journal of Testing and Evaluation. 46: 20170345
Glover JL, Hudson LT. (2016) An objectively-analyzed method for measuring the useful penetration of x-ray imaging systems. Measurement Science & Technology. 27
Seely J, Feldman U, Hudson L, et al. (2015) Betatron x-ray spectra recorded by a transmission crystal spectrometer in the 10 keV to 70 keV photon energy range Icops/Beams 2014 - 41st Ieee International Conference On Plasma Science and the 20th International Conference On High-Power Particle Beams
Hudson LT, Glover JL, Minniti R. (2014) The Metrology of a Rastered Spot of X Rays used in Security Screening. Journal of Research of the National Institute of Standards and Technology. 119: 540-553
Seely JF, Hudson LT, Glover JL, et al. (2014) Ultra-thin curved transmission crystals for high resolving power (up to E/ΔE = 6300) x-ray spectroscopy in the 6-13  keV energy range. Optics Letters. 39: 6839-42
Seely JF, Glover JL, Hudson LT, et al. (2014) Measurement of high-energy (10-60 keV) x-ray spectral line widths with eV accuracy. The Review of Scientific Instruments. 85: 11D618
Seely JF, Hudson LT, Glover JL, et al. (2014) Ultra-thin curved transmission crystals for high resolving power (up to E/ΔE = 6300) x-ray spectroscopy in the 6-13 keV energy range Optics Letters. 39: 6839-6842
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