Edward H. Wahl, Ph.D.

Affiliations: 
2001 Stanford University, Palo Alto, CA 
Area:
Fluid and Plasma Physics, Materials Science Engineering
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Parents

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Charles H. Kruger grad student 2001 Stanford
 (Laser -based diagnostics of diamond synthesis reactors.)
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Publications

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Lommatzsch U, Wahl EH, Aderhold D, et al. (2001) Cavity ring-down spectroscopy of CH and CD radicals in a diamond thin film chemical vapor deposition reactor Applied Physics A. 73: 27-33
Lommatzsch U, Wahl EH, Aderhold D, et al. (2001) Cavity ring-down spectroscopy of CH and CD radicals in a diamond thin film chemical vapor deposition reactor Applied Physics a: Materials Science and Processing. 73: 27-33
Lommatzsch U, Wahl EH, Owano TG, et al. (2000) Spatial concentration and temperature distribution of CH radicals formed in a diamond thin-film hot-filament reactor Chemical Physics Letters. 320: 339-344
Zhao M, Wahl EH, Owano TG, et al. (2000) Near-surface reduction of cavity ring-down spectroscopy detection sensitivity Chemical Physics Letters. 318: 555-560
Wahl EH, Owano TG, Kruger CH, et al. (1999) Spatially resolved measurements of CH concentration and temperature in a hot-filament CVD reactor 30th Plasmadynamic and Lasers Conference
Xie J, Paldus B, Wahl E, et al. (1998) Near-infrared cavity ringdown spectroscopy of water vapor in an atmospheric flame Chemical Physics Letters. 284: 387-395
Xie J, Paldus BA, Wahl EH, et al. (1998) Near-infrared cavity ringdown spectroscopy of water vapor in an atmospheric flame Chemical Physics Letters. 284: 387-395
Spence TG, Paldus BA, Wahl EH, et al. (1998) Employing cavity ring-down spectroscopy to probe dilute species in hostile environments Ieee International Conference On Plasma Science. 122
Wahl E, Owano T, Kruger C, et al. (1997) Spatially resolved measurements of absolute CH3 concentration in a hot-filament reactor Diamond and Related Materials. 6: 476-480
Wahl EH, Owano TG, Kruger CH, et al. (1997) Spatially resolved measurements of absolute CH3 concentration in a hot-filament reactor Diamond and Related Materials. 6: 476-480
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