Christopher E. Moffitt, Ph.D.
Affiliations: | 2000 | University of Missouri - Kansas City, USA |
Area:
Condensed Matter Physics, Aerospace Engineering, Chemical EngineeringGoogle:
"Christopher Moffitt"Mean distance: (not calculated yet)
Parents
Sign in to add mentorDavid M. Wieliczka | grad student | 2000 | University of Missouri - Kansas City | |
(Surface and interface characterization for low temperature plasma interface engineering of aluminum alloy surfaces.) |
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Publications
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El-Agez TM, Wieliczka DM, Moffitt C, et al. (2011) Aging of Oxygen-Treated Trimethylsilane Plasma-Polymerized Films Using Spectroscopic Ellipsometry Journal of Atomic, Molecular, and Optical Physics. 2011: 1-6 |
El-Agez TM, Wieliczka DM, Moffitt CE, et al. (2011) Spectroscopic ellipsometry time study of low-temperature plasma-polymerized plain trimethylsilane thin films deposited on silicon Physica Scripta. 84 |
Yu Q, Moffitt CE, Wieliczka DM, et al. (2002) Corrosion protection of ion vapor deposition (IVD) Al-coated Al alloys by low-temperature plasma interface engineering: Part III - DC cathodic polymerization in a closed reactor system Progress in Organic Coatings. 44: 37-47 |
Yasuda HK, Yu QS, Reddy CM, et al. (2002) Adhesion of the plasma polymer of trimethylsilane to aluminum alloys Journal of Applied Polymer Science. 85: 1387-1398 |
Yasuda HK, Yu QS, Reddy CM, et al. (2002) Adhesion of spray primers to plasma polymer coatings Journal of Applied Polymer Science. 85: 1443-1457 |
Yasuda HK, Yu QS, Reddy CM, et al. (2001) “Barrier-Adhesion” Principle for Corrosion Protection Corrosion. 57: 670-679 |
Yu QS, Reddy CM, Moffitt CE, et al. (2001) Improved corrosion protection of aluminum alloys by system approach interface engineering: Part 4- Spray paint primer-coated aluminum alloys Corrosion. 57: 802-814 |
Yu Q, Moffitt CE, Wieliczka DM, et al. (2001) dc cathodic polymerization of trimethylsilane in a closed reactor system Journal of Vacuum Science and Technology, Part a: Vacuum, Surfaces and Films. 19: 2163-2167 |
Yasuda HK, Yu QS, Reddy CM, et al. (2001) Effects of wall contamination on consecutive plasma processes Journal of Vacuum Science and Technology, Part a: Vacuum, Surfaces and Films. 19: 2074-2082 |
Moffitt CE, Yu QS, Reddy CM, et al. (2001) XPS analysis of the aging of thin, adhesion promoting, fluorocarbon treatments of DC plasma polymers Plasmas and Polymers. 6: 193-209 |