Joshua M. Pomeroy, Ph.D.

Affiliations: 
2002 Cornell University, Ithaca, NY, United States 
Area:
Condensed Matter Physics
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"Joshua Pomeroy"
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Parents

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Joel Brock grad student 2002 Cornell
 (Hyperthermal ion epitaxy of metal thin films.)
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Publications

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Stambaugh C, Shakeel H, Litorja M, et al. (2020) Linking mass measured by the quartz crystal microbalance to the SI Metrologia. 57: 025002
Tang K, Kim HS, Ramanayaka ANR, et al. (2019) A compact, ultra-high vacuum ion source for isotopically enriching and depositing Si thin films. The Review of Scientific Instruments. 90: 083308
Ramanayaka AN, Tang K, Hagmann JA, et al. (2019) Use of quantum effects as potential qualifying metrics for “quantum grade silicon” Aip Advances. 9: 125153
Tang K, Kim HS, Ramanayaka AN, et al. (2019) A compact, UHV ion source for enriching 28Si and depositing epitaxial thin films Review of Scientific Instruments. 90
Ramanayaka AN, Kim HS, Tang K, et al. (2018) STM patterned nanowire measurements using photolithographically defined implants in Si(100). Scientific Reports. 8: 1790
Ramanayaka AN, Kim H, Hagmann JA, et al. (2018) Towards superconductivity in p-type delta-doped Si/Al/Si heterostructures Aip Advances. 8: 075329
Dwyer KJ, Kim HS, Simons DS, et al. (2017) Temperature dependent 29Si incorporation during deposition of highly enriched 28Si films. Physical Review Materials. 1
Wei H, Pomeroy J. (2016) Application of the double paddle oscillator for quantifying environmental, surface mass variation. Metrologia. 53: 869-880
Dwyer KJ, Pomeroy JM, Simons DS, et al. (2014) Enriching 28Si beyond 99.9998 % for semiconductor quantum computing Journal of Physics D: Applied Physics. 47
Lake RE, Sosolik CE, Pomeroy JM. (2013) Classical over-the-barrier model for neutralization of highly charged ions above thin dielectric films Physical Review a - Atomic, Molecular, and Optical Physics. 87
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