Peter J. McNulty
Affiliations: | Clemson University, Clemson, SC, United States |
Area:
Elementary Particles and High Energy Physics, Electronics and Electrical EngineeringGoogle:
"Peter McNulty"Bio:
https://inspirehep.net/record/997979?ln=en
DOI: 10.1103/PhysRevLett.14.611
Mean distance: (not calculated yet)
Parents
Sign in to add mentorPiyare Lal Jain | grad student | 1965 | SUNY Buffalo | |
(Muon - nucleon inelastic interactions.) |
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Publications
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Reed RA, Weller RA, Akkerman A, et al. (2013) Anthology of the development of radiation transport tools as applied to single event effects Ieee Transactions On Nuclear Science. 60: 1876-1911 |
McNulty PJ, Poole KF, Scheick LZ, et al. (2011) Role of process variation in the radiation response of FGMOS devices Ieee Transactions On Nuclear Science. 58: 2673-2679 |
McNulty PJ, Poole KF, Crissler M, et al. (2006) Sensitivity and dynamic range of FGMOS dosemeters. Radiation Protection Dosimetry. 122: 460-2 |
Cellere G, Paccagnella A, Visconti A, et al. (2006) Single-ion dosemeter based on floating gate memories. Radiation Protection Dosimetry. 122: 457-9 |
Chabane H, Vaillé JR, Barelaud B, et al. (2006) Measurement of the energy depositions in a silicon volume by 14 MeV neutrons Ieee Transactions On Nuclear Science. 53: 3707-3712 |
McNulty PJ, Kinnison JD, Maurer RH, et al. (2004) Energy-deposition events measured by the CRRES PHA experiment Ieee Transactions On Nuclear Science. 51: 3381-3387 |
Kinnison JD, Maurer R, Roth DR, et al. (2003) Neutron-Induced Pion Production in Silicon-Based Circuits Ieee Transactions On Nuclear Science. 50: 2251-2255 |
McNulty PJ, Yow S, Scheick LZ, et al. (2002) Charge removal from FGMOS floating gates Ieee Transactions On Nuclear Science. 49: 3016-3021 |
Reed RA, Marshall PW, Kim HS, et al. (2002) Evidence for angular effects in proton-induced single-event upsets Ieee Transactions On Nuclear Science. 49: 3038-3044 |
McNulty PJ, Scheick LZ, Yow S, et al. (2001) Single-chip dosimeters to accompany photometric systems flown in space Ieee Transactions On Nuclear Science. 48: 2039-2042 |