Ian V. Mitchell
Affiliations: | The University of Western Ontario (Canada) |
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Condensed Matter PhysicsGoogle:
"Ian Mitchell"Mean distance: (not calculated yet)
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Sign in to add trainee| Paul G. Piva | grad student | 2002 | The University of Western Ontario (Canada) |
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Publications
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| Vos M, Mitchell IV. (2019) Anisotropic strain relaxation in the case of Au/Pd(110) interface formation. Physical Review. B, Condensed Matter. 45: 9398-9401 |
| Lu ZH, Sham TK, Vos M, et al. (2019) Unoccupied d states of Au impurities in silicon as studied by x-ray-absorption spectroscopy. Physical Review. B, Condensed Matter. 45: 8811-8814 |
| Zhang PX, Mitchell IV, Tong BY, et al. (2019) Depth-dependent disordering in a-Si produced by self-ion-implantation. Physical Review. B, Condensed Matter. 50: 17080-17084 |
| Harmer SL, Goncharova LV, Kolarova R, et al. (2007) Surface structure of sphalerite studied by medium energy ion scattering and XPS Surface Science. 601: 352-361 |
| Ruffell S, Mitchell IV, Simpson PJ. (2006) Solid phase epitaxial regrowth of amorphous layers in silicon created by low energy phosphorus implantation: A medium energy ion scattering study Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 242: 591-594 |
| Ruffell S, Mitchell IV, Simpson PJ. (2005) Solid-phase epitaxial regrowth of amorphous layers in Si(100) created by low-energy, high-fluence phosphorus implantation Journal of Applied Physics. 98 |
| Simpson TW, Mitchell IV. (2005) Effect of annealing temperature ramp rate on bubble formation in helium-implanted silicon Applied Physics Letters. 86: 1-3 |
| Ruffell S, Simpson PJ, Mitchell IV. (2005) Electrical characterization of 5 keV phosphorous implants in silicon Journal of Applied Physics. 98 |
| Ruffell S, Mitchell IV, Simpson PJ. (2005) Annealing behavior of low-energy ion-implanted phosphorus in silicon Journal of Applied Physics. 97 |
| Piva PG, Mitchell IV, Chen H, et al. (2005) InGaAs/InP quantum well intermixing studied by high-resolution x-ray diffraction and grazing incidence x-ray analysis Journal of Applied Physics. 97 |