Torgny Gustafsson
Affiliations: | Rutgers University, New Brunswick, New Brunswick, NJ, United States |
Area:
Condensed Matter PhysicsWebsite:
https://physics.rutgers.edu/people/faculty-list/emeritus-profile/gustafsson-torgnyGoogle:
"Torgny Gustafsson"Bio:
https://libris.kb.se/bib/86477
Mean distance: (not calculated yet)
Children
Sign in to add trainee| Paul A Fenter | grad student | 1984-1990 | Penn (Chemistry Tree) |
| Brett W. Busch | grad student | 2000 | Rutgers, New Brunswick |
| Dmitri G. Starodoub | grad student | 2003 | Rutgers, New Brunswick |
| Tian Feng | grad student | 2011 | Rutgers, New Brunswick |
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Publications
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| Kasaei L, Manichev V, Li M, et al. (2019) Normal-state and superconducting properties of Co-doped BaFe2As2 and MgB2 thin films after focused helium ion beam irradiation Superconductor Science and Technology. 32: 95009 |
| Pitthan E, Amarasinghe VP, Xu C, et al. (2019) Chemical state of phosphorous at the SiC/SiO 2 interface Thin Solid Films. 675: 172-176 |
| Hijazi H, Li M, Barbacci D, et al. (2019) Channeling in the helium ion microscope Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions With Materials and Atoms. 456: 92-96 |
| Li X, Lee SS, Li M, et al. (2018) Effect of nitrogen passivation on interface composition and physical stress in SiO2/SiC(4H) structures Applied Physics Letters. 113: 131601 |
| Kasaei L, Melbourne T, Manichev V, et al. (2018) MgB2 Josephson junctions produced by focused helium ion beam irradiation Aip Advances. 8: 75020 |
| Woods KN, Thomas MC, Mitchson G, et al. (2017) Non-uniform Composition Profiles in Amorphous Multi-Metal Oxide Thin Films Deposited from Aqueous Solution. Acs Applied Materials & Interfaces |
| Li X, Ermakov A, Amarasinghe V, et al. (2017) Oxidation induced stress in SiO2/SiC structures Applied Physics Letters. 110: 141604 |
| Pitthan E, Amarasinghe VP, Xu C, et al. (2017) 4H-SiC surface energy tuning by nitrogen up-take Applied Surface Science. 402: 192-197 |
| Giordani A, Lee HD, Xu C, et al. (2016) Temperature dependent Cs retention, distribution, and ion yield changes during Cs+ bombardment SIMS Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 34 |
| Sina M, Alvarado J, Shobukawa H, et al. (2016) Direct Visualization of the Solid Electrolyte Interphase and Its Effects on Silicon Electrochemical Performance Advanced Materials Interfaces. 3: 1600438-1600438 |