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John Silcox

Affiliations: 
1961- Applied and Engineering Physics Cornell University, Ithaca, NY, United States 
Area:
Condensed Matter Physics, Materials Science Engineering
Website:
https://www.aep.cornell.edu/faculty-directory/john-silcox
Google:
"John Silcox"
Bio:

https://www.gf.org/fellows/all-fellows/john-silcox/
DOI: 10.1080/14786435908238228

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Parents

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Peter B. Hirsch grad student 1961 Cambridge

Children

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Philip E. Batson grad student Cornell (E-Tree)
Gerald J. Dolan grad student 1973 Cornell
David A Muller grad student 1991-1996 Cornell
Tyler J. Eustis grad student 2004 Cornell
K. Andre Mkhoyan grad student 2004 Cornell (E-Tree)
Zhiheng Yu grad student 2004 Cornell
Sara E. Zacher grad student 2009 Cornell

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Publications

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Wang X, Ren X, Kahen K, et al. (2009) Non-blinking semiconductor nanocrystals. Nature. 459: 686-9
Andre Mkhoyan K, Contryman AW, Silcox J, et al. (2009) Atomic and electronic structure of graphene-oxide. Nano Letters. 9: 1058-63
Yu Z, Hahn MA, Maccagnano-Zacher SE, et al. (2008) Small-angle rotation in individual colloidal CdSe quantum rods. Acs Nano. 2: 1179-88
Silcox J. (2008) Microscopy: Spot the atom. Nature. 454: 283-4
Ozatay O, Gowtham PG, Tan KW, et al. (2008) Sidewall oxide effects on spin-torque- and magnetic-field-induced reversal characteristics of thin-film nanomagnets. Nature Materials. 7: 567-73
Mkhoyan KA, Maccagnano-Zacher SE, Kirkland EJ, et al. (2008) Effects of amorphous layers on ADF-STEM imaging. Ultramicroscopy. 108: 791-803
Muller DA, Kourkoutis LF, Murfitt M, et al. (2008) Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy. Science (New York, N.Y.). 319: 1073-6
Mkhoyan KA, Maccagnano-Zacher SE, Thomas MG, et al. (2008) Critical role of inelastic interactions in quantitative electron microscopy. Physical Review Letters. 100: 025503
Maccagnano-Zacher SE, Mkhoyan KA, Kirkland EJ, et al. (2008) Effects of tilt on high-resolution ADF-STEM imaging. Ultramicroscopy. 108: 718-26
Yu Z, Muller DA, Silcox J. (2008) Effects of specimen tilt in ADF-STEM imaging of a-Si/c-Si interfaces. Ultramicroscopy. 108: 494-501
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