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H. A. Seifert, Ph.D.

Affiliations: 
2003 University of Michigan, Ann Arbor, Ann Arbor, MI 
Area:
Nuclear Engineering, Biomedical Engineering, Radiology
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David K. Wehe grad student 2003 University of Michigan
 (The resolving power of X -ray microtomography systems used for evaluating bone specimens.)

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McGregor DS, He Z, Seifert HA, et al. (1998) Single charge carrier type sensing with a parallel strip pseudo-Frisch-grid CdZnTe semiconductor radiation detector Applied Physics Letters. 72: 792-794
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