Cristian Tivarus, Ph.D.
Affiliations: | 2005 | Ohio State University, Columbus, Columbus, OH |
Area:
Condensed Matter PhysicsGoogle:
"Cristian Tivarus"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| Jonathan Pelz | grad student | 2005 | Ohio State | |
| (Schottky barrier formation at metal -quantum well interfaces studied with ballistic electron emission microscopy.) | ||||
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Publications
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| Haick H, Pelz JP, Ligonzo T, et al. (2006) Controlling Au/n-GaAs junctions by partial molecular monolayers Physica Status Solidi (a) Applications and Materials Science. 203: 3438-3451 |
| Tivarus C, Pelz JP, Hudait MK, et al. (2005) Direct measurement of quantum confinement effects at metal to quantum-well nanocontacts. Physical Review Letters. 94: 206803 |
| Tivarus C, Pelz JP, Hudait MK, et al. (2005) Spatial resolution of ballistic electron emission microscopy measured on metal/quantum-well Schottky contacts Applied Physics Letters. 87: 1-3 |
| Tivarus C, Park KB, Hudait MK, et al. (2005) Nanoscale characterization of metal/semiconductor nanocontacts Aip Conference Proceedings. 788: 280-284 |
| Hudait MK, Lin Y, Palmisiano MN, et al. (2004) Comparison of mixed anion, InAs yP 1-y and mixed cation, In xAl 1-xAs metamorphic buffers grown by molecular beam epitaxy on (100) InP substrates Journal of Applied Physics. 95: 3952-3960 |
| Heller ER, Tivarus C, Pelz JP. (2003) Avalanche ballistic electron emission microscopy with single hot-electron sensitivity Applied Physics Letters. 83: 2841-2843 |
| Hudait MK, Lin Y, Wilt DM, et al. (2003) High-quality InAsyP1-y step-graded buffer by molecular-beam epitaxy Applied Physics Letters. 82: 3212-3214 |
| Tivarus C, Ding Y, Pelz JP. (2002) Calculated potential profile near charged threading dislocations at metal/semiconductor interfaces Journal of Applied Physics. 92: 6010-6013 |