Kenneth D. Fourspring, Ph.D.

Affiliations: 
2013 Imaging Science Rochester Institute of Technology, Rochester, NY, United States 
Area:
Optics Physics, General Physics, Electronics and Electrical Engineering
Google:
"Kenneth Fourspring"
Mean distance: (not calculated yet)
 

Parents

Sign in to add mentor
Zoran Ninkov grad student 2013 Rochester Institute of Technology
 (Assessing the Performance of Digital Micromirror Devices(TM) for use in Space-Based Multi-Object Spectrometers.)
BETA: Related publications

Publications

You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect.

Hassanalieragh M, Ignjatovic Z, Newman JD, et al. (2020) Design and Characterization of a 10 × 10 Pixel Array THz Camera in 350 nm CMOS Technology Ieee Sensors Journal. 20: 9834-9848
Zhang C, Ninkov Z, Fertig G, et al. (2015) Optical simulation of terahertz antenna using finite difference time domain method Proceedings of Spie - the International Society For Optical Engineering. 9483
Sacco AP, Newman JD, Lee PPK, et al. (2015) Transmission imaging measurements at 188 GHz with 0.35μm CMOS technology Proceedings of Spie - the International Society For Optical Engineering. 9483
Sacco AP, Newman JD, Lee PPK, et al. (2014) THz imaging Si MOSFET system design at 215 GHz Proceedings of Spie - the International Society For Optical Engineering. 9102
Fourspring KD, Ninkov Z, Fodness BC, et al. (2013) Proton radiation testing of digital micromirror devices for space applications Optical Engineering. 52: 91807-91807
Fourspring K, Ninkov Z. (2012) Optical characterization of a micro-grid polarimeter Proceedings of Spie. 8364
Fourspring KD, Ninkov Z, Kerekes JP. (2010) Scattered Light in a DMD based Multi-Object Spectrometer Proceedings of Spie. 7739
Kerekes JP, Presnar MD, Fourspring KD, et al. (2009) Sensor modeling and demonstration of a multi-object spectrometer for performance-driven sensing Proceedings of Spie - the International Society For Optical Engineering. 7334
See more...