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Otto Scherzer grad student 1965 Technische Hochschule Darmstadt
 (Allgemeine Abbildungs-Eigenschaften unrunder Elektronenlinsen mit gerader optischer Achse.)
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Li Z, Biskupek J, Kaiser U, et al. (2022) Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick Samples. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-11
Rose H. (2022) Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector. Ultramicroscopy. 235: 113484
Mohn MJ, Biskupek J, Lee Z, et al. (2020) Lattice contrast in the core-loss EFTEM signal of graphene. Ultramicroscopy. 219: 113119
Lee Z, Lehnert T, Kaiser U, et al. (2019) Comparison of different imaging models handling partial coherence for aberration-corrected HRTEM at 40-80 kV. Ultramicroscopy
Rose H, Nejati A, Müller H. (2019) Magnetic Cc/Cs-corrector compensating for the chromatic aberration and the spherical aberration of electron lenses. Ultramicroscopy. 203: 139-144
Lee Z, Kaiser U, Rose H. (2018) Prospects of annular differential phase contrast applied for optical sectioning in STEM. Ultramicroscopy. 196: 58-66
Lee Z, Hambach R, Kaiser U, et al. (2016) Significance of matrix diagonalization in modelling inelastic electron scattering. Ultramicroscopy. 175: 58-66
Linck M, Hartel P, Uhlemann S, et al. (2016) Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV. Physical Review Letters. 117: 076101
Ophus C, Ciston J, Pierce J, et al. (2016) Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry. Nature Communications. 7: 10719
Lee Z, Biskupek J, Lehnert T, et al. (2016) Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations Microscopy and Microanalysis. 22: 894-895
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