Harald Rose
Affiliations: | 1980-2000 | Technische Universität Darmstadt |
Area:
Electron microscopyWebsite:
https://de.wikipedia.org/wiki/Harald_Rose_(Physiker)Google:
"Harald Rose"Bio:
http://www.tu-darmstadt.de/universitaet/selbstverstaendnis/profil_geschichte/persoenlichkeiten/thema_perso_k10_2.de.jsp
http://www.wolffund.org.il/index.php?dir=site&page=winners&cs=291&language=eng
https://inspirehep.net/record/1053923?ln=en
Mean distance: (not calculated yet)
Parents
Sign in to add mentorOtto Scherzer | grad student | 1965 | Technische Hochschule Darmstadt | |
(Allgemeine Abbildungs-Eigenschaften unrunder Elektronenlinsen mit gerader optischer Achse.) |
Children
Sign in to add traineeGeorg Heinz Hoffstaetter | grad student | 1991 | Technische Universität Darmstadt |
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Publications
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Li Z, Biskupek J, Kaiser U, et al. (2022) Integrated Differential Phase Contrast (IDPC)-STEM Utilizing a Multi-Sector Detector for Imaging Thick Samples. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-11 |
Rose H. (2022) Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector. Ultramicroscopy. 235: 113484 |
Mohn MJ, Biskupek J, Lee Z, et al. (2020) Lattice contrast in the core-loss EFTEM signal of graphene. Ultramicroscopy. 219: 113119 |
Lee Z, Lehnert T, Kaiser U, et al. (2019) Comparison of different imaging models handling partial coherence for aberration-corrected HRTEM at 40-80 kV. Ultramicroscopy |
Rose H, Nejati A, Müller H. (2019) Magnetic Cc/Cs-corrector compensating for the chromatic aberration and the spherical aberration of electron lenses. Ultramicroscopy. 203: 139-144 |
Lee Z, Kaiser U, Rose H. (2018) Prospects of annular differential phase contrast applied for optical sectioning in STEM. Ultramicroscopy. 196: 58-66 |
Lee Z, Hambach R, Kaiser U, et al. (2016) Significance of matrix diagonalization in modelling inelastic electron scattering. Ultramicroscopy. 175: 58-66 |
Linck M, Hartel P, Uhlemann S, et al. (2016) Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV. Physical Review Letters. 117: 076101 |
Ophus C, Ciston J, Pierce J, et al. (2016) Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry. Nature Communications. 7: 10719 |
Lee Z, Biskupek J, Lehnert T, et al. (2016) Experimental Contrast of Atomically-resolved Cc/Cs-corrected 20-80kV SALVE Images of 2D-objects Matches Calculations Microscopy and Microanalysis. 22: 894-895 |