Kenneth Carless Smith, PhD
Affiliations: | 1960- | Electrical Engineering | University of Toronto, Toronto, ON, Canada |
Area:
Circuits, Multiple-Valued Logic, Computer Music, Human-Computer Interaction, DatabasesWebsite:
https://www.ece.utoronto.ca/people/smith-k-c/Google:
"Kenneth C. Smith"Bio:
(1932 - 2023)
https://www.eecg.toronto.edu/~pagiamt/kcsmith/
https://scholar.google.com/citations?user=TjDUa_UAAAAJ&hl=en
Mean distance: (not calculated yet)
Parents
Sign in to add mentorRobert W McKay | grad student | 1960 | University of Toronto | |
(Flux reversal in ferrites.) |
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Publications
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Daly DC, Fujino LC, Smith KC. (2017) Through the Looking Glass -- The 2017 Edition: Trends in Solid-State Circuits from ISSCC Ieee Solid-State Circuits Magazine. 9: 12-22 |
Narendra SG, Fujino LC, Smith KC. (2015) Through the looking glass? the 2015 edition: Trends in solid-state circuits from ISSCC Ieee Solid-State Circuits Magazine. 7: 14-24 |
Smith KC, Wang A, Fujino LC. (2012) Through the Looking Glass: Trend Tracking for ISSCC 2012 Ieee Solid-State Circuits Magazine. 4: 4-20 |
Rafati R, Fakhraie SM, Smith KC. (2006) A 16-Bit Barrel-Shifter Implemented in Data-Driven Dynamic Logic ( $D ^3 L$ ) Ieee Transactions On Circuits and Systems. 53: 2194-2202 |
Chong CP, Salama CAT, Smith KC. (1992) Real-time edge detection and image segmentation Analog Integrated Circuits and Signal Processing. 2: 117-130 |
Schultz KJ, Francis RJ, Smith KC. (1990) Ganged CMOS: trading standby power for speed Ieee Journal of Solid-State Circuits. 25: 870-873 |
Ho H-, Smith KC. (1990) SC and pass transistor combined circuits Electronics Letters. 26: 769-770 |
Chong CP, Smith KC, Vranesic ZG. (1989) Using active components to perform voltage division in digital-to-analog conversion Ieee Journal of Solid-State Circuits. 24: 999-1002 |
Chong CP, Smith KC. (1987) Sinusoidal oscillators employing current conveyors International Journal of Electronics. 62: 515-520 |
Mouftah HT, Smith KC. (1985) CMOS integrated circuits for multivalued logic International Journal of Electronics. 58: 43-50 |