John B. Pethica

Affiliations: 
Materials University of Oxford, Oxford, United Kingdom 
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"John Pethica"
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Adrian B. Mann grad student Oxford (E-Tree)
Peter M. Hoffmann post-doc Oxford
Timothy Weihs post-doc Oxford (Chemistry Tree)
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Brazil O, de Silva JP, Chowdhury M, et al. (2020) In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM Journal of Materials Research. 35: 654-654
Clarke AR, Pethica JB, Nieminen JA, et al. (2019) Quantitative scanning tunneling microscopy at atomic resolution: Influence of forces and tip configuration. Physical Review Letters. 76: 1276-1279
Brazil O, Usov V, Pethica JB, et al. (2017) Large area thermal nanoimprint below the glass transition temperature via small amplitude oscillatory shear forming Microelectronic Engineering. 182: 35-41
O'Brien SJ, Ozer HO, Cross GLW, et al. (2011) Multiparameter imaging and understanding the role of the tip - Atomic resolution images of rutile TiO 2(110) Materials Research Society Symposium Proceedings. 1318: 127-135
McKenzie W, Pethica J, Cross G. (2011) A direct-write, resistless hard mask for rapid nanoscale patterning of diamond Diamond and Related Materials. 20: 707-710
McGovern IT, Ozer HO, Pethica JB, et al. (2009) The adsorption and decomposition of H2S on Ge(001): An STM study E-Journal of Surface Science and Nanotechnology. 7: 203-206
Tang B, Ngan AH, Pethica JB. (2008) A method to quantitatively measure the elastic modulus of materials in nanometer scale using atomic force microscopy. Nanotechnology. 19: 495713
Rowland HD, King WP, Cross GL, et al. (2008) Measuring glassy and viscoelastic polymer flow in molecular-scale gaps using a flat punch mechanical probe. Acs Nano. 2: 419-28
Rowland HD, King WP, Pethica JB, et al. (2008) Molecular confinement accelerates deformation of entangled polymers during squeeze flow. Science (New York, N.Y.). 322: 720-4
Matei G, Jeffery S, Patil S, et al. (2008) Simultaneous normal and shear measurements of nanoconfined liquids in a fiber-based atomic force microscope. The Review of Scientific Instruments. 79: 023706
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