Stephanie N. Bogle, Ph.D.
Affiliations: | 2009 | University of Illinois, Urbana-Champaign, Urbana-Champaign, IL |
Area:
Materials Science EngineeringGoogle:
"Stephanie Bogle"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| John R Abelson | grad student | 2009 | UIUC | |
| (Quantifying nanoscale order in amorphous materials via fluctuation electron microscopy.) | ||||
BETA: Related publications
See more...
Publications
|
You can help our author matching system! If you notice any publications incorrectly attributed to this author, please sign in and mark matches as correct or incorrect. |
| Li TT, Bogle SN, Abelson JR. (2014) Quantitative fluctuation electron microscopy in the STEM: methods to identify, avoid, and correct for artifacts. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 1605-18 |
| Lee B, Shelby RM, Raoux S, et al. (2014) Nanoscale nuclei in phase change materials: Origin of different crystallization mechanisms of Ge2Sb2Te5 and AgInSbTe Journal of Applied Physics. 115: 063506 |
| Bogle S, Rasshchupkyna M, Bugaev V, et al. (2012) Identifying Nanostructure in Metallic Glasses using Electron Cross-Correlation Analysis Microscopy and Microanalysis. 18: 1252-1253 |
| Wochner P, Castro-Colin M, Bogle SN, et al. (2011) Of fluctuations and cross-correlations: finding order in disorder International Journal of Materials Research. 102: 874-888 |
| Haberl B, Bogle SN, Li T, et al. (2011) Unexpected short- and medium-range atomic structure of sputtered amorphous silicon upon thermal annealing Journal of Applied Physics. 110: 096104 |
| Bogle SN, Nittala LN, Twesten RD, et al. (2010) Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy Ultramicroscopy. 110: 1273-1278 |
| Lee BS, Burr GW, Shelby RM, et al. (2009) Observation of the role of subcritical nuclei in crystallization of a glassy solid. Science (New York, N.Y.). 326: 980-4 |
| Bogle SN, Voyles PM, Khare SV, et al. (2007) Quantifying nanoscale order in amorphous materials: Simulating fluctuation electron microscopy of amorphous silicon Journal of Physics Condensed Matter. 19 |
| Kwon M, Lee B, Bogle SN, et al. (2007) Nanometer-scale order in amorphous Ge2Sb2Te5 analyzed by fluctuation electron microscopy Applied Physics Letters. 90: 021923 |
| Nguyen-Tran T, Suendo V, Roca I Cabarrocas P, et al. (2006) Fluctuation microscopy evidence for enhanced nanoscale structural order in polymorphous silicon thin films Journal of Applied Physics. 100 |