Johann Peisl

Affiliations: 
University of Munich, München, Bayern, Germany 
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"Johann Peisl"
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Vitta S, Metzger TH, Peisl J. (2012) Structure and normal incidence soft-x-ray reflectivity of Ni-Nb/C amorphous multilayers. Applied Optics. 36: 1472-81
Beck U, Metzger TH, Peisl J, et al. (2003) Erratum: “Diffuse x-ray rods and scattering from point defect clusters in ion implanted silicon” [Appl. Phys. Lett. 76, 2698 (2000)] Applied Physics Letters. 83: 2489-2489
Landmesser G, Finlayson TR, Johnson RL, et al. (2003) Phonon anomalies in displacive phase transitions by surface X-ray scattering Journal De Physique Iv. 112: 123-127
Plech A, Klemradt U, Aspelmeyer M, et al. (2002) Solid-liquid interface of a 2-propanol-perfluoromethylcyclohexane mixture: from adsorption to wetting. Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics. 65: 061604
Kegel I, Metzger TH, Lorke A, et al. (2001) Determination of strain fields and composition of self-organized quantum dots using x-ray diffraction Physical Review B. 63: 35318
Plech A, Klemradt U, Peisl J. (2001) Wetting transition and pretransitional thin films in binary liquids: alcohol/perfluoromethylcyclohexane mixtures studied by x-ray reflectivity Journal of Physics: Condensed Matter. 13: 5563-5576
Plech A, Salditt T, Münster C, et al. (2000) Investigation of Structure and Growth of Self-Assembled Polyelectrolyte Layers by X-ray and Neutron Scattering under Grazing Angles. Journal of Colloid and Interface Science. 223: 74-82
Klemradt U, Aspelmeyer M, Abe H, et al. (2000) Premonitory martensitic surface relief via novel x-ray diffuse and laser light reflectivity from the (ool)-surface of a ni63al37 single crystal Materials Research Society Symposium - Proceedings. 580: 293-302
Plech A, Klemradt U, Huber M, et al. (2000) Wetting transition of a binary liquid mixture at a solid boundary Epl. 49: 583-589
Paniago R, Metzger H, Rauscher M, et al. (2000) Grazing incidence small-angle X-ray scattering from laterally ordered triangular pyramidal Ge islands on Si(111) Journal of Applied Crystallography. 33: 433-436
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