Yuan Ping Feng
Affiliations: | Physics | National University of Singapore, Singapore, Singapore |
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"Yuan Feng"Mean distance: (not calculated yet)
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Sign in to add trainee| Meng Lee Leek | grad student | ||
| Tao Zhu | grad student | 2014-2018 | National University of Singapore |
| Andy Paul Chen | grad student | 2015-2018 | National University of Singapore |
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Publications
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| Yang T, Luo YZ, Wang Z, et al. (2021) AgS monolayer: an ultrasoft inorganic Lieb lattice. Nanoscale. 13: 14008-14015 |
| Wang D, Wang Z, Liu W, et al. (2020) Atomic-Level Electronic Properties of Carbon Nitride Monolayers. Acs Nano |
| Chen AP, Lin W, Chen J, et al. (2020) Thickness and Ferroelectric Polarization Influence on Film Magnetic Anisotropy across a Multiferroic Material Interface. Acs Applied Materials & Interfaces |
| Zhang L, Yang T, He X, et al. (2020) Molecular Beam Epitaxy of Two-Dimensional Vanadium-Molybdenum Diselenide Alloys. Acs Nano |
| Tang CS, Yin X, Zeng S, et al. (2020) Interfacial Oxygen-Driven Charge Localization and Plasmon Excitation in Unconventional Superconductors. Advanced Materials (Deerfield Beach, Fla.). e2000153 |
| Lin W, Yang B, Chen AP, et al. (2020) Perpendicular Magnetic Anisotropy and Dzyaloshinskii-Moriya Interaction at an Oxide/Ferromagnetic Metal Interface. Physical Review Letters. 124: 217202 |
| Tang CS, Yin X, Yang M, et al. (2020) Anisotropic Collective Charge Excitations in Quasimetallic 2D Transition-Metal Dichalcogenides. Advanced Science (Weinheim, Baden-Wurttemberg, Germany). 7: 1902726 |
| Li Z, Zhang X, Zhao X, et al. (2020) Imprinting Ferromagnetism and Superconductivity in Single Atomic Layers of Molecular Superlattices. Advanced Materials (Deerfield Beach, Fla.). e1907645 |
| Chen AP, Feng YP. (2020) Modulating Multiferroic Control of Magnetocrystalline Anisotropy using 5 Transition Metal Capping Layers. Acs Applied Materials & Interfaces |
| Ang MC, Tang CG, Koh Q, et al. (2020) Bulk ion-clustering and surface ion-layering effects on work function of self-compensated charged-doped polymer semiconductors Materials Horizons. 7: 1073-1082 |