Emmanuel Jonah
Affiliations: | Physics | University of Cape Town, Cape Town, Western Cape, South Africa |
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| Setshedi R, Zambou S, Jonah E, et al. (2020) A quantitative structural characterisation of active semiconducting materials (mSi; SiO2; Al2O3; TiO2) for use in printed electronics using a combination of Small Angle Light Scattering (SALS) and Ultra Small Angle X-ray Scattering (USAXS). Nanotechnology |
| Zambou S, Azeutsap FM, Nuessl R, et al. (2018) Switching alternating current (AC) using a fully screen-printed current-driven transistor Iet Power Electronics. 11: 168-174 |
| Unuigbe DM, Harting M, Jonah EO, et al. (2017) Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy. Journal of Synchrotron Radiation. 24: 1017-1023 |
| Jonah EO, Härting M, Gullikson E, et al. (2014) Investigation of surface topology of printed nanoparticle layers using wide-angle low-Q scattering. Journal of Synchrotron Radiation. 21: 547-53 |
| Männl U, Chuvilin A, Magunje B, et al. (2013) Interfacial and Network Characteristics of Silicon Nanoparticle Layers Used in Printed Electronics Japanese Journal of Applied Physics. 52 |
| Britton DT, Walton SD, Zambou S, et al. (2013) A novel mode of current switching dependent on activated charge transport Aip Advances. 3: 82110 |
| Rai DK, Beaucage G, Jonah EO, et al. (2012) Quantitative investigations of aggregate systems. The Journal of Chemical Physics. 137: 044311 |
| Jonah EO, Britton DT, Beaucage P, et al. (2012) Topological investigation of electronic silicon nanoparticulate aggregates using ultra-Small-Angle X-Ray scattering Journal of Nanoparticle Research. 14 |
| Britton DT, Odo EA, Gonfa GG, et al. (2009) Size distribution and surface characteristics of silicon nanoparticles Journal of Applied Crystallography. 42: 448-456 |