Byunghoo Jung, Ph.D.

Affiliations: 
2005 University of Minnesota, Twin Cities, Minneapolis, MN 
Area:
Electronics and Electrical Engineering
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"Byunghoo Jung"

Parents

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Ramesh Harjani grad student 2005 UMN
 (High-speed analog RF front -end circuit design.)
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Publications

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Thakuria N, Saha AK, Thirumala SK, et al. (2019) Oscillators Utilizing Ferroelectric-Based Transistors and Their Coupled Dynamics Ieee Transactions On Electron Devices. 66: 2415-2423
Kim BC, Jung B. (2019) Monolithically Integrated Silicon Photodiode-Based FIR Filter in 65 nm CMOS Technology Ieee Photonics Technology Letters. 31: 1359-1361
Sengupta A, Liyanagedera CM, Jung B, et al. (2017) Magnetic Tunnel Junction as an On-Chip Temperature Sensor. Scientific Reports. 7: 11764
Seo W, Yu W, Tan T, et al. (2017) Diaper-Embedded Urinary Tract Infection Monitoring Sensor Module Powered by Urine-Activated Batteries. Ieee Transactions On Biomedical Circuits and Systems
Dak P, Seo W, Jung B, et al. (2017) A Physics-Based (Verilog-A) Compact Model for DC, Quasi-Static Transient, Small-Signal, and Noise Analysis of MOSFET-Based pH Sensors Ieee Transactions On Electron Devices. 64: 1285-1293
Bhagavatula S, Jung B. (2016) Variation Resilient Power Sensor With an 80-ns Response Time for Fine-Grained Power Management Ieee Transactions On Very Large Scale Integration (Vlsi) Systems
Roy K, Jung B, Peroulis D, et al. (2016) Integrated Systems in the More-Than-Moore Era: Designing Low-Cost Energy-Efficient Systems Using Heterogeneous Components Ieee Design and Test. 33: 56-65
Kim BC, Park K, Jung B. (2016) An FIR Filter Using Segmented Photodiodes for Silicon Photodiode Equalization Ieee Photonics Technology Letters. 28: 2515-2518
Kundu S, Alpman E, Lu JHL, et al. (2015) A 1.2 v 2.64 GS/s 8 bit 39 mW Skew-Tolerant Time-interleaved SAR ADC in 40 nm Digital LP CMOS for 60 GHz WLAN Ieee Transactions On Circuits and Systems I: Regular Papers. 62: 1929-1939
Bhagavatula S, Jung B, Lu Y. (2014) Real-Time Power Sensors for Intelligent Power Management and Beyond Ieee Design & Test of Computers. 31: 27-35
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