Ricardo Augusto da Luz Reis
Affiliations: | Universidade Federal do Rio Grande do Sul (UFRGS) |
Area:
Microelectronics, Physical Design, EDA, MPSoCs, Fault ToleranceGoogle:
"Ricardo Reis"Children
Sign in to add trainee| José Luís Güntzel | grad student | ||
| Marcelo de Oliveira Johann | grad student | Universidade Federal do Rio Grande do Sul (UFRGS) | |
| Cristina Meinhardt | grad student | Universidade Federal do Rio Grande do Sul (UFRGS) (Computer Science Tree) |
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Publications
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| Brendler LH, Zimpeck AL, Meinhardt C, et al. (2020) Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology Ieee Transactions On Circuits and Systems I-Regular Papers. 67: 553-564 |
| Rosa FRd, Garibotti R, Ost L, et al. (2019) Using Machine Learning Techniques to Evaluate Multicore Soft Error Reliability Ieee Transactions On Circuits and Systems I-Regular Papers. 66: 2151-2164 |
| Ramos EdA, Bontorin G, Reis R. (2019) A New Nonlinear Global Placement for FPGAs: The Chaotic Place Ieee Transactions On Circuits and Systems I-Regular Papers. 66: 2165-2174 |
| Rodrigues GS, Rosa F, Oliveira ABd, et al. (2017) Analyzing the Impact of Fault-Tolerance Methods in ARM Processors Under Soft Errors Running Linux and Parallelization APIs Ieee Transactions On Nuclear Science. 64: 2196-2203 |
| Chielle E, Rosa F, Rodrigues GS, et al. (2016) Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques Ieee Transactions On Nuclear Science. 63: 2208-2216 |
| Posser G, Mishra V, Jain P, et al. (2016) Cell-Internal Electromigration: Analysis and Pin Placement Based Optimization Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 35: 220-231 |
| Bartra WEC, Vladimirescu A, Reis R. (2016) FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects Microelectronics Reliability. 64: 152-157 |
| Blokhina E, Deltimple N, Trocan M, et al. (2016) Introduction to the special issue on ICECS 2014 Analog Integrated Circuits and Signal Processing. 87: 101-103 |
| Tonfat J, Kastensmidt FL, Rech P, et al. (2015) Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs Ieee Transactions On Nuclear Science. 62: 3080-3087 |
| Rosa FR, Brum RM, Wirth G, et al. (2015) Impact of dynamic voltage scaling and thermal factors on SRAM reliability Microelectronics Reliability. 55: 1486-1490 |