| Year |
Citation |
Score |
| 2012 |
Wang X, Lockwood R, Vick D, Li P, Meldrum A, Malac M. A convenient method for electron tomography sample preparation using a focused ion beam. Microscopy Research and Technique. 75: 1165-9. PMID 22461153 DOI: 10.1002/Jemt.22044 |
0.537 |
|
| 2011 |
Titova LV, Cocker TL, Cooke DG, Wang X, Meldrum A, Hegmann FA. Ultrafast percolative transport dynamics in silicon nanocrystal films Physical Review B - Condensed Matter and Materials Physics. 83. DOI: 10.1103/Physrevb.83.085403 |
0.312 |
|
| 2011 |
Wang X, Lockwood R, Vick D, Meldrum A, Malac M. A New Method to Fabricate 3D Electron Tomography Sample Using FIB Technique Microscopy and Microanalysis. 17: 690-691. DOI: 10.1017/S1431927611004326 |
0.534 |
|
| 2011 |
Wang X, Li P, Malac M, Lockwood R, Meldrum A. The spatial distribution of silicon NCs and erbium ion clusters by simultaneous high-resolution energy filtered and Z-contrast STEM and transmission electron tomography Physica Status Solidi (C) Current Topics in Solid State Physics. 8: 1038-1043. DOI: 10.1002/Pssc.201000393 |
0.55 |
|
| 2010 |
Li P, Concepcion P, Wang X, Malac M, Meldrum A. Electron Tomography of Si and Er Particles in SiOx film Without Missing Wedge Microscopy and Microanalysis. 16: 1886-1887. DOI: 10.1017/S143192761006280X |
0.56 |
|
| 2010 |
Wang X, Malac M, Meldrum A, Lockwood R, Li P, Furukawa H. Limits of Tomographic Reconstruction of Discrete Nanoparticles Microscopy and Microanalysis. 16: 1868-1869. DOI: 10.1017/S143192761006068X |
0.481 |
|
| 2009 |
Li P, Wang X, Malac M, Egerton R, Meldrum A, Lenz F, Liang X, Wang J. 3D imaging of Si and Er Nanoclusters in Er Doped SiO1.5 films by STEM tomography Microscopy and Microanalysis. 15: 1256-1257. DOI: 10.1017/S1431927609093143 |
0.586 |
|
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