| Year |
Citation |
Score |
| 2008 |
Burnette JE, Kiesel S, Sayers DE, Nemanich RJ. Titanium Interlayer Mediated Epitaxy of CoSi2 on Si1-xGex Thin Solid Films. 516: 1809-1817. DOI: 10.1016/J.Tsf.2007.08.045 |
0.313 |
|
| 2006 |
Connor DM, Sayers D, Sumner DR, Zhong Z. Diffraction enhanced imaging of controlled defects within bone, including bone-metal gaps. Physics in Medicine and Biology. 51: 3283-300. PMID 16757877 DOI: 10.1088/0031-9155/51/12/019 |
0.352 |
|
| 2005 |
Burnette JE, Nemanich RJ, Sayers DE. Formation of stable titanium germanosilicide thin films on Si 1-xGe x Journal of Applied Physics. 97. DOI: 10.1063/1.1923164 |
0.364 |
|
| 2005 |
Connor DM, Sayers D, Sumner DR, Zhong Z. Identification of fatigue damage in cortical bone by diffraction enhanced imaging Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 548: 234-239. DOI: 10.1016/J.Nima.2005.03.095 |
0.304 |
|
| 2004 |
Kiss MZ, Sayers DE, Zhong Z, Parham C, Pisano ED. Improved image contrast of calcifications in breast tissue specimens using diffraction enhanced imaging. Physics in Medicine and Biology. 49: 3427-39. PMID 15379023 DOI: 10.1088/0031-9155/49/15/008 |
0.736 |
|
| 2003 |
Kiss MZ, Sayers DE, Zhong Z. Measurement of image contrast using diffraction enhanced imaging. Physics in Medicine and Biology. 48: 325-40. PMID 12608610 DOI: 10.1088/0031-9155/48/3/304 |
0.736 |
|
| 2002 |
Hasnah MO, Zhong Z, Oltulu O, Pisano E, Johnston RE, Sayers D, Thomlinson W, Chapman D. Diffraction enhanced imaging contrast mechanisms in breast cancer specimens. Medical Physics. 29: 2216-21. PMID 12408294 DOI: 10.1118/1.1507782 |
0.381 |
|
| 2002 |
Zhong Z, Chapman D, Connor D, Dilmanian A, Gmur N, Hasnah M, Johnston RE, Kiss MZ, Li J, Muehleman C, Oltulu O, Parham C, Pisano E, Rigon L, Sayers D, et al. Diffraction enhanced imaging of soft tissues Synchrotron Radiation News. 15: 27-34. DOI: 10.1080/08940880208602986 |
0.722 |
|
| 2002 |
Platow W, Oh J, Nemanich RJ, Sayers DE, Hartman JD, Davis RF. TiC nanoisland formation on 6H-SiC(0001) Si Journal of Applied Physics. 91: 6081-6084. DOI: 10.1063/1.1465121 |
0.362 |
|
| 2002 |
Zhong Z, Chapman D, Hasnah M, Johnston E, Kiss MZ, Oltulu O, Rigon L, Zhong N, Pisano E, Sayers D, Thomlinson W. X-ray diffraction order selection with a prism in DEI (abstract) Review of Scientific Instruments. 73: 1614. DOI: 10.1063/1.1448126 |
0.73 |
|
| 2002 |
Kiss MZ, Sayers DE, Zhong Z. Comparison of X-ray detectors for a diffraction enhanced imaging system Nuclear Instruments and Methods in Physics Research, Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 491: 280-290. DOI: 10.1016/S0168-9002(02)01125-7 |
0.739 |
|
| 2001 |
Platow W, Wood DE, Burnette JE, Nemanich RJ, Sayers DE. XAFS studies of the formation of cobalt silicide on (square root of 3 x square root of 3) SiC(0001). Journal of Synchrotron Radiation. 8: 475-7. PMID 11512820 DOI: 10.1107/S0909049500017921 |
0.327 |
|
| 2001 |
Platow W, Wood DK, Tracy KM, Burnette JE, Nemanich RJ, Sayers DE. Formation of cobalt disilicide films on (√3×√3)6H-SiC(0001) Physical Review B - Condensed Matter and Materials Physics. 63: 1153121-1153127. DOI: 10.1103/Physrevb.63.115312 |
0.348 |
|
| 2001 |
Platow W, Nemanich RJ, Sayers DE, Hartman JD, Davis RF. Growth of epitaxial CoSi2 on 6H-SiC(0001)Si Journal of Applied Physics. 90: 5924-5927. DOI: 10.1063/1.1412842 |
0.4 |
|
| 2001 |
Lucovsky G, Rayner GB, Kang D, Appel G, Johnson RS, Zhang Y, Sayers DE, Ade H, Whitten JL. Electronic structure of noncrystalline transition metal silicate and aluminate alloys Applied Physics Letters. 79: 1775-1777. DOI: 10.1063/1.1404997 |
0.349 |
|
| 2000 |
Pisano ED, Johnston RE, Chapman D, Geradts J, Iacocca MV, Livasy CA, Washburn DB, Sayers DE, Zhong Z, Kiss MZ, Thomlinson WC. Human breast cancer specimens: diffraction-enhanced imaging with histologic correlation--improved conspicuity of lesion detail compared with digital radiography. Radiology. 214: 895-901. PMID 10715065 DOI: 10.1148/Radiology.214.3.R00Mr26895 |
0.726 |
|
| 2000 |
Zhong Z, Thomlinson W, Chapman D, Sayers D. Implementation of diffraction-enhanced imaging experiments: at the NSLS and APS Nuclear Instruments and Methods in Physics Research Section a: Accelerators, Spectrometers, Detectors and Associated Equipment. 450: 556-567. DOI: 10.1016/S0168-9002(00)00308-9 |
0.37 |
|
| 1999 |
Boyanov BI, Goeller PT, Sayers DE, Nemanich RJ. The effect of germanium on the Co-SiGe thin-film reaction. Journal of Synchrotron Radiation. 6: 521-3. PMID 15263366 DOI: 10.1107/S0909049599000060 |
0.31 |
|
| 1999 |
Porto AO, Boyanov BI, Sayers DE, Nemanich RJ. Cobalt silicide formation on 6H silicon carbide. Journal of Synchrotron Radiation. 6: 188-9. PMID 15263243 DOI: 10.1107/S0909049599001326 |
0.32 |
|
| 1999 |
Goeller PT, Boyanov BI, Sayers DE, Nemanich RJ, Myers AF, Steel EB. Germanium segregation in the Co/SiGe/Si(001) thin film system Journal of Materials Research. 14: 4372-4384. DOI: 10.1557/Jmr.1999.0592 |
0.354 |
|
| 1999 |
Kemner K, Sayers D. XAFS x conference in Chicago Synchrotron Radiation News. 12: 2-4. DOI: 10.1080/08940889908261005 |
0.328 |
|
| 1999 |
Boyanov BI, Goeller PT, Sayers DE, Nemanich RJ. Growth of epitaxial CoSi2 on SiGe(001) Journal of Applied Physics. 86: 1355-1362. DOI: 10.1063/1.370894 |
0.303 |
|
| 1998 |
Chapman D, Pisano E, Thomlinson W, Zhong Z, Johnston RE, Washburn D, Sayers D, Malinowska K. Medical applications of diffraction enhanced imaging. Breast Disease. 10: 197-207. PMID 15687575 DOI: 10.3233/Bd-1998-103-419 |
0.406 |
|
| 1998 |
Sayers DE, Goeller PT, Boyanov BI, Nemanich RJ. In situ studies of metal-semiconductor interactions with synchrotron radiation. Journal of Synchrotron Radiation. 5: 1050-1. PMID 15263741 DOI: 10.1107/S0909049597015240 |
0.322 |
|
| 1998 |
Boyanov BI, Goeller PT, Sayers DE, Nemanich R. Thickness Effects in the Reaction of Cobalt with Slicon-Germanium Alloys Mrs Proceedings. 514: 165-170. DOI: 10.1557/Proc-514-165 |
0.332 |
|
| 1998 |
Chapman D, Thomlinson W, Zhong Z, Johnston RE, Pisano E, Washburn D, Sayers D, Segre C. Diffraction enhanced imaging applied to materials science and medicine Synchrotron Radiation News. 11: 4-11. DOI: 10.1080/08940889808260849 |
0.341 |
|
| 1998 |
Boyanov BI, Goeller PT, Sayers DE, Nemanich RJ. Film thickness effects in the Co–Si1−xGex solid phase reaction Journal of Applied Physics. 84: 4285-4291. DOI: 10.1063/1.368872 |
0.39 |
|
| 1998 |
Goeller PT, Boyanov BI, Sayers DE, Nemanich RJ. Co-deposition of cobalt disilicide on silicon-germanium thin films Thin Solid Films. 320: 206-210. DOI: 10.1016/S0040-6090(97)00941-3 |
0.357 |
|
| 1997 |
Chapman D, Thomlinson W, Johnston RE, Washburn D, Pisano E, Gmür N, Zhong Z, Menk R, Arfelli F, Sayers D. Diffraction enhanced x-ray imaging. Physics in Medicine and Biology. 42: 2015-25. PMID 9394394 DOI: 10.1088/0031-9155/42/11/001 |
0.434 |
|
| 1997 |
Wang Z, Aldrich DB, Nemanich R, Sayers DE. Electrical And Structural Properties Of Zirconium Germanosilicide Formed By A Bilayer Solid State Reaction Of Zr With Strained Si1-Xgex Alloys Journal of Applied Physics. 82: 2342-2348. DOI: 10.1063/1.366043 |
0.34 |
|
| 1997 |
Boyanov BI, Goeller PT, Sayers DE, Newmanich RJ. Preferential Co-Si bonding at the Co/SiGe(100) interface Applied Physics Letters. 71: 3060-3062. DOI: 10.1063/1.119436 |
0.379 |
|
| 1997 |
Wang Z, Goeller PT, Boyanov BI, Sayers DE, Nemanich R. An lntegrated Growth and Analysis System for In-Situ XAS Studies of Metal- Semiconductor Interactions Journal De Physique Iv. 7. DOI: 10.1051/Jp4/1997096 |
0.337 |
|
| 1997 |
Hesterberg D, Sayers DE, Zhou W, Plummer GM, Robarge WP. X-ray absorption spectroscopy of lead and zinc speciation in a contaminated groundwater aquifer Environmental Science and Technology. 31: 2840-2846. DOI: 10.1021/Es970077W |
0.313 |
|
| 1997 |
Goeller PT, Boyanov BI, Sayers DE, Nemanich RJ. Structure and stability of cobalt-silicon-germanium thin films Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions With Materials and Atoms. 133: 84-89. DOI: 10.1016/S0168-583X(97)00458-8 |
0.336 |
|
| 1996 |
Aldrich DB, d'Heurle FM, Sayers DE, Nemanich RJ. Interface stability of Ti(SiGe)2 and SiGe alloys: Tie lines in the ternary equilibrium diagram. Physical Review. B, Condensed Matter. 53: 16279-16282. PMID 9983463 DOI: 10.1103/Physrevb.53.16279 |
0.317 |
|
| 1996 |
Johnston RE, Washburn D, Pisano E, Burns C, Thomlinson WC, Chapman LD, Arfelli F, Gmur NF, Zhong Z, Sayers D. Mammographic phantom studies with synchrotron radiation. Radiology. 200: 659-63. PMID 8756911 DOI: 10.1148/Radiology.200.3.8756911 |
0.331 |
|
| 1996 |
Goeller PT, Boyanov BI, Sayers DE, Nemanich RJ. Thin Films of CoSi2 Co-Deposited onto Si1-xGexAlloys Mrs Proceedings. 448. DOI: 10.1557/Proc-448-365 |
0.316 |
|
| 1996 |
Goeller PT, Wang Z, Sayers DE, Glass JT, Nemanich RJ. Epitaxial films of cobalt disilicide (100) evaporated onto Si(100) from a mixed source Materials Research Society Symposium - Proceedings. 402: 511-516. DOI: 10.1557/Proc-402-511 |
0.379 |
|
| 1996 |
Aldrich DB, Chen YL, Sayers DE, Nemanich RJ. Titanium germanosilicide phase formation during the Ti-Si1-xGex solid phase reactions Materials Research Society Symposium - Proceedings. 402: 405-410. DOI: 10.1557/Proc-402-405 |
0.302 |
|
| 1996 |
Chapman D, Thomlinson W, Arfelli F, Gmür N, Zhong Z, Menk R, Johnson RE, Washburn D, Pisano E, Sayers D. Mammography imaging studies using a Laue crystal analyzer Review of Scientific Instruments. 67: 3360-3360. DOI: 10.1063/1.1147502 |
0.385 |
|
| 1996 |
Gmür NF, Thomlinson W, Johnson RE, Washburn D, Pisano E, Arfelli F, Chapman LD, Menk R, Zhong Z, Sayers D. Monochromatic beam mammography studies using synchrotron radiation (abstract) Review of Scientific Instruments. 67: 3360-3360. DOI: 10.1063/1.1147501 |
0.368 |
|
| 1995 |
Ma Q, Zhou W, Sayers DE, Paesler MA. Photoinduced structural changes in amorphous As2S3 as measured by differential anomalous x-ray scattering. Physical Review. B, Condensed Matter. 52: 10025-10034. PMID 9980048 DOI: 10.1103/Physrevb.52.10025 |
0.368 |
|
| 1995 |
Pfeiffer G, Rehr JJ, Sayers DE. XAFS near-edge structure of As2S3: A comparison of experiment and theory. Physical Review. B, Condensed Matter. 51: 804-810. PMID 9978229 DOI: 10.1103/Physrevb.51.804 |
0.32 |
|
| 1995 |
Coe EM, Bowen LH, Speer JA, Wang Z, Sayers DE, Bereman RD. The recharacterization of a polysaccharide iron complex (Niferex) Journal of Inorganic Biochemistry. 58: 269-278. PMID 7500088 DOI: 10.1016/0162-0134(94)00060-N |
0.322 |
|
| 1995 |
Wang Z, Aldrich DB, Goeller P, Nemanich RJ, Sayers DE. Characterization of Zirconium Germanosilicide Formed by Solid State Reaction of ZR With Si l−x Ge x Alloys Mrs Proceedings. 402: 387. DOI: 10.1557/Proc-402-387 |
0.345 |
|
| 1995 |
Aldrich DB, D'Heurle FM, Sayers DE, Nemanich RJ. Interface Stability of Ti(Sil−yGey)2 and Si1−x Gex Alloys Mrs Proceedings. 402. DOI: 10.1557/Proc-402-21 |
0.375 |
|
| 1995 |
Aldrich DB, Chen YL, Sayers DE, Nemanich RJ, Ashburn SP, Öztürk MC. Effect of composition on phase formation and morphology in Ti-Si1-xGex solid phase reactions Journal of Materials Research. 10: 2849-2863. DOI: 10.1557/Jmr.1995.2849 |
0.311 |
|
| 1995 |
Dao Y, Sayers DE, Nemanich RJ. Phase stabilities and surface morphologies of (Ti1-xZr x)Si2 thin films on Si(100) Journal of Applied Physics. 78: 6584-6591. DOI: 10.1063/1.360479 |
0.368 |
|
| 1995 |
Aldrich DB, Heck HL, Chen YL, Sayers DE, Nemanich RJ. Film thickness effects in the Ti-Si1-xGex solid phase reaction Journal of Applied Physics. 78: 4958-4965. DOI: 10.1063/1.359786 |
0.332 |
|
| 1995 |
Aldrich DB, Chen YL, Sayers DE, Nemanich RJ, Ashburn SP, Öztürk MC. Stability of C54 titanium germanosilicide on a silicon-germanium alloy substrate Journal of Applied Physics. 77: 5107-5114. DOI: 10.1063/1.359321 |
0.335 |
|
| 1995 |
Pfeiffer G, Rehr JJ, Sayers DE. The near edge structure of a-As2S3 and pressure-induced changes Physica B: Physics of Condensed Matter. 208: 385-386. DOI: 10.1016/0921-4526(94)01034-X |
0.321 |
|
| 1995 |
Ma Q, Lee JF, Sayers DE. X-ray diffraction anomalous fine structure study of a supported Pt catalyst Physica B: Physics of Condensed Matter. 208: 663-664. DOI: 10.1016/0921-4526(94)00780-Y |
0.341 |
|
| 1995 |
Wang Z, Nemanich RJ, Sayers DE. EXAFS and XRD studies of phase formations of Co in reactions with SiGe alloys Physica B: Physics of Condensed Matter. 208: 567-568. DOI: 10.1016/0921-4526(94)00753-I |
0.32 |
|
| 1995 |
Dao Y, Edwards AM, Nemanich RJ, Sayers DE. Local structural studies of (Ti1-xZrx)Si2 thin films on Si(111) Physica B: Physics of Condensed Matter. 208: 513-514. DOI: 10.1016/0921-4526(94)00738-H |
0.388 |
|
| 1995 |
Dao Y, Sayers DE, Nemanich RJ. Morphology and stability of (Ti0.9Zr0.1) Si2 thin films on Si(111) and Si(100) formed in UHV Thin Solid Films. 270: 544-548. DOI: 10.1016/0040-6090(95)06843-0 |
0.331 |
|
| 1995 |
Wang Z, Aldrich DB, Chen YL, Sayers DE, Nemanich RJ. Silicide formation and stability of Ti SiGe and Co SiGe Thin Solid Films. 270: 555-560. DOI: 10.1016/0040-6090(95)06841-4 |
0.335 |
|
| 1994 |
Aldrich DB, Nemanich RJ, Sayers DE. Bond-length relaxation in Si1-xGex alloys. Physical Review. B, Condensed Matter. 50: 15026-15033. PMID 9975851 DOI: 10.1103/Physrevb.50.15026 |
0.343 |
|
| 1994 |
Wang Z, Chen YL, Ying H, Nemanich RJ, Sayers DE. Phase formations in Co/Si, Co/Ge, and Co/Si1-xGex by solid phase reactions Materials Research Society Symposium Proceedings. 320: 397-402. DOI: 10.1557/Proc-320-397 |
0.314 |
|
| 1994 |
Ying H, Wang Z, Aldrich DB, Sayers DE, Nemanich RJ. Raman scattering study of interface reactions of Co/SiGe Materials Research Society Symposium Proceedings. 320: 335-340. DOI: 10.1557/Proc-320-335 |
0.316 |
|
| 1994 |
Aldrich DB, Chen YL, Sayers DE, Nemanich RJ. Titanium germanosilicide: phase formation, segregation, and morphology Materials Research Society Symposium Proceedings. 320: 305-310. DOI: 10.1557/Proc-320-305 |
0.35 |
|
| 1994 |
Edwards AM, Dao Y, Nemanich RJ, Sayers DE, Kemner KM. Structural investigation of the initial interface region formed by thin zirconium films on silicon (111) Journal of Applied Physics. 76: 4630-4635. DOI: 10.1063/1.357299 |
0.387 |
|
| 1994 |
Dao Y, Edwards AM, Ying H, Chen YL, Sayers DE, Nemanich RJ. Structural and electrical properties of (Ti0.9Zr 0.1)Si2 thin films on Si(111) Applied Physics Letters. 65: 2413-2415. DOI: 10.1063/1.112692 |
0.333 |
|
| 1993 |
Zhou W, Sayers DE, Paesler MA, Bouchet-Fabre B, Ma Q, Raoux D. Structure and photoinduced structural changes in a-As2S3 films: A study by differential anomalous x-ray scattering. Physical Review. B, Condensed Matter. 47: 686-694. PMID 10005542 DOI: 10.1103/Physrevb.47.686 |
0.373 |
|
| 1993 |
Aldrich DB, Nemanich RJ, Sayers DE. Xafs study of some titanium silicon and germanium compounds Japanese Journal of Applied Physics. 32: 725-727. DOI: 10.7567/Jjaps.32S2.725 |
0.335 |
|
| 1993 |
Dao Y, Edwards AM, Nemanich RJ, Sayers DE. X-ray Absorption Study of the Reaction of Zirconium Thin Films on Silicon(111) Japanese Journal of Applied Physics. 32: 396. DOI: 10.7567/Jjaps.32S2.396 |
0.412 |
|
| 1993 |
Edwards AM, Dao Y, Nemanich RJ, Sayers DE. Exafs study of the initial interface region formed by thin zirconium and titanium films on silicon(111) Japanese Journal of Applied Physics. 32: 393-395. DOI: 10.7567/Jjaps.32S2.393 |
0.356 |
|
| 1993 |
Dao Y, Edwards AM, Sayers DE, Nemanich R. Local Structural Studies of TiSi2 and ZrSi2 Thin Films on Si(111) Surfaces Mrs Proceedings. 320: 367-372. DOI: 10.1557/Proc-320-362 |
0.308 |
|
| 1993 |
Aldrich DB, Sayers DE, Nemanich RJ. Investigation of titanium silicon and germanium reaction Materials Research Society Symposium Proceedings. 280: 585-588. DOI: 10.1557/Proc-280-585 |
0.38 |
|
| 1992 |
Zhou W, Paesler MA, Sayers DE. Structure and photoinduced structural changes in nonstoichiometric a-AsxS1-x: A study by x-ray-absorption fine structure. Physical Review. B, Condensed Matter. 46: 3817-3825. PMID 10004105 DOI: 10.1103/Physrevb.46.3817 |
0.327 |
|
| 1992 |
Nasu T, Koch CC, Edwards AM, Sayers DE. An EXAFS study of structural changes induced by mechanical milling of the Ni3Al ordered intermetallic compound Journal of Non-Crystalline Solids. 150: 491-496. DOI: 10.1016/0022-3093(92)90180-R |
0.355 |
|
| 1991 |
Zhou W, Paesler M, Sayers DE. Structure of germanium-selenium glasses: An x-ray-absorption fine-structure study. Physical Review. B, Condensed Matter. 43: 2315-2321. PMID 9997507 DOI: 10.1103/Physrevb.43.2315 |
0.393 |
|
| 1991 |
Zhou W, Paesler MA, Sayers DE. Structural study of evaporated amorphous As4S4 films by x-ray-absorption fine structure. Physical Review. B, Condensed Matter. 43: 11920-11925. PMID 9996967 DOI: 10.1103/Physrevb.43.11920 |
0.318 |
|
| 1991 |
Aldrich D, Jahncke C, Nemanich R, Sayers D. Investigation of Titanium Germanide Formation by Raman Scattering and X-Ray Absorption Spectroscopy Mrs Proceedings. 221. DOI: 10.1557/Proc-221-343 |
0.371 |
|
| 1991 |
Zhou W, Paesler M, Sayers DE. Structure of germanium-selenium glasses: An x-ray-absorption fine-structure study Physical Review B. 43: 2315-2321. DOI: 10.1103/PhysRevB.43.2315 |
0.304 |
|
| 1991 |
Zhou W, Sayers DE, Paesler MA, Raoux D. Intermediate range order - A differential anomalous x-ray scattering study in a -As2S3 Journal of Non-Crystalline Solids. 137: 127-130. DOI: 10.1016/S0022-3093(05)80073-0 |
0.407 |
|
| 1990 |
Pfeiffer G, Zhou W, Lee JM, Yang CY, Sayers DE, Paesler MA. Photodarkening in amorphous arsenic chalcogenides: Microscopic mechanisms and compositional trends Solid State Ionics. 39: 99-104. DOI: 10.1016/0167-2738(90)90031-L |
0.377 |
|
| 1990 |
Lee JM, Paesler MA, Sayers DE, Fontaine A. Kinetic X-ray absorption studies and computer structural modelling of photo-darkening in amorphous arsenic sulfide Journal of Non-Crystalline Solids. 123: 295-309. DOI: 10.1016/0022-3093(90)90799-R |
0.366 |
|
| 1989 |
Aldrich D, Fiordalice R, Jeon H, Islam Q, Nemanich R, Sayers D. X-Ray Absorption Studies of Titanium Silicide Formation at the Interface of Ti Deposited on Si Mrs Proceedings. 159. DOI: 10.1557/Proc-159-167 |
0.408 |
|
| 1989 |
Lamble GM, Heald SM, Sayers DE, Ziegler E, Viccaro PJ. Tungsten-carbon multilayer composition and the effects of annealing: A glancing angle extended x-ray absorption fine structure study Journal of Applied Physics. 65: 4250-4255. DOI: 10.1063/1.343308 |
0.382 |
|
| 1989 |
Morrison TI, Lien NC, Sayers DE, Heald SM, Fareria L, Scrofani J. A dedicated soft X-ray XAS beamline Physica B: Physics of Condensed Matter. 158: 330-331. DOI: 10.1016/0921-4526(89)90301-3 |
0.37 |
|
| 1989 |
Lee JM, Paesler MA, Sayers DE, Fontaine A. Dispersive X-ray absorption study of the kinetics of photo-induced structural changes in glassy As2S3 Physica B: Physics of Condensed Matter. 158: 52-53. DOI: 10.1016/0921-4526(89)90195-6 |
0.387 |
|
| 1989 |
Hayes GH, Budnick JI, Pease DM, Hines WA, Choi MH, Heald SM, Sayers DE. Study of metglas 2605 CO by extended and near edge X-ray absorption fine structure Journal of Magnetism and Magnetic Materials. 80: 371-378. DOI: 10.1016/0304-8853(89)90144-3 |
0.377 |
|
| 1989 |
Yang CY, Sayers DE, Paesler MA. Local bonding configurations of amorphous SexTe1-x films Journal of Non-Crystalline Solids. 114: 67-69. DOI: 10.1016/0022-3093(89)90070-7 |
0.348 |
|
| 1989 |
Lee JM, Pfeiffer G, Paesler MA, Sayers DE, Fontaine A. Photon intensity-dependent darkening kinetics in optical and structural anisotropy in a-As2S3: A study of X-ray absorption spectroscopy Journal of Non-Crystalline Solids. 114: 52-54. DOI: 10.1016/0022-3093(89)90065-3 |
0.339 |
|
| 1989 |
Zhou W, Lee JM, Sayers DE, Paesler MA. An exafs study of compositional trends and photo-induced structural changes in amorphous AsXS1-x thin films Journal of Non-Crystalline Solids. 114: 43-45. DOI: 10.1016/0022-3093(89)90062-8 |
0.361 |
|
| 1987 |
Choi M, Budnick JI, Hayes GH, Pease DM, Heald SM, Sayers DE, Hasegawa R. Extended x-ray-absorption fine-structure study of amorphous (NixPt100-x)75P25 alloys. Physical Review. B, Condensed Matter. 36: 4613-4623. PMID 9943472 DOI: 10.1103/Physrevb.36.4613 |
0.322 |
|
| 1987 |
Yang CY, Paesler MA, Sayers DE. Determination of bond strengths of arsenic and arsenic chalcogen compounds using the temperature dependence of extended x-ray-absorption fine structure. Physical Review. B, Condensed Matter. 36: 980-988. PMID 9942903 DOI: 10.1103/Physrevb.36.980 |
0.363 |
|
| 1987 |
Yang CY, Paesler MA, Sayers DE. Measurement of local structural configurations associated with reversible photostructural changes in arsenic trisulfide films. Physical Review. B, Condensed Matter. 36: 9160-9167. PMID 9942780 DOI: 10.1103/Physrevb.36.9160 |
0.337 |
|
| 1987 |
Lamble GM, Heald SM, Sayers DE, Ziegler DE. Glancing Angle EXAFS Studies of Tungsten-Carbon Multilayers Mrs Proceedings. 103. DOI: 10.1557/Proc-103-101 |
0.316 |
|
| 1986 |
YANG CY, LEE JM, PAESLER MA, SAYERS DE. EXAFS STUDIES OF THERMOSTRUCTURAL AND PHOTOSTRUCTURAL CHANGES OF VAPOR-DEPOSITED AMORPHOUS As2S3 FILMS Le Journal De Physique Colloques. 47: C8-387-C8-390. DOI: 10.1051/Jphyscol:1986876 |
0.309 |
|
| 1986 |
THEIL EC, SAYERS DE, YANG CY, FONTAINE A, DARTYGE E. THE FORMATION, STRUCTURE AND DISSOLUTION OF THE FERRITIN IRON CORE STUDIED BY X-RAY ABSORPTION SPECTROSCOPY Le Journal De Physique Colloques. 47: C8-1155-C8-1157. DOI: 10.1051/Jphyscol:19868225 |
0.365 |
|
| 1986 |
Linkous CA, O'Grady WE, Sayers D, Yang CY. Spectrophotometric and x-ray absorption edge study of complexation of carbon monoxide with ferric tetrasulfophthalocyanine in alkaline solution Inorganic Chemistry. 25: 3761-3765. DOI: 10.1021/Ic00241A011 |
0.325 |
|
| 1986 |
Yang CY, Paesler MA, Sayers DE. First crystallization of arsenic trisulfide from bulk glass: The synthesis of orpiment Materials Letters. 4: 233-235. DOI: 10.1016/0167-577X(86)90013-3 |
0.385 |
|
| 1985 |
Morrison TI, Paesler MA, Sayers DE, Tsu R, Gonzalez-Hernandez J. Electronic characterization of the ordering of a-Ge with the use of x-ray-absorption near-edge structure. Physical Review. B, Condensed Matter. 31: 5474-5476. PMID 9936519 DOI: 10.1103/Physrevb.31.5474 |
0.399 |
|
| 1985 |
Emrich RJ, Mansour AN, Sayers DE, McMillan ST, Katzer JR. An examination of a rhodium/magnesium oxide catalyst using x-ray absorption spectroscopy The Journal of Physical Chemistry. 89: 4261-4264. DOI: 10.1002/Chin.198552025 |
0.34 |
|
| 1985 |
KONINGSBERGER DC, VAN ZON JBAD, VAN'T BLIK HFJ, VISSER GJ, PRINS R, MANSOUR AN, SAYERS DE, SHORT DR, KATZER JR. ChemInform Abstract: AN EXTENDED X-RAY ABSORPTION FINE STRUCTURE STUDY OF RHODIUM-OXYGEN BONDS IN A HIGHLY DISPERSED RHODIUM/ALUMINUM OXIDE CATALYST Chemischer Informationsdienst. 16. DOI: 10.1002/Chin.198551012 |
0.352 |
|
| 1984 |
Grant PM, Gill WD, Morawitz H, Bechgaard K, Sayers DE. X-ray-absorption near-edge-structure studies in hexamethylenetetraselenafulvalene (HMTSF) and HMTSF-tetracyanoquinodimethane (HMTSF-TCNQ) and -tetrafluorotetracyanoquinodimethane (HMTSF-TFTCNQ) Physical Review B. 30: 6973-6977. DOI: 10.1103/Physrevb.30.6973 |
0.338 |
|
| 1984 |
Mansour AN, Cook JW, Sayers DE. Quantitative technique for the determination of the number of unoccupied d-electron states in a platinum catalyst using the L2,3 X-ray absorption edge spectra Journal of Physical Chemistry. 88: 2330-2334. DOI: 10.1021/J150655A029 |
0.332 |
|
| 1984 |
Mansour AN, Cook JW, Sayers DE, Emrich RJ, Katzer JR. Determination of support and reduction effects for Pt Al2O3 and Pt SiO2 by X-ray absorption spectroscopy Journal of Catalysis. 89: 462-469. DOI: 10.1016/0021-9517(84)90322-1 |
0.322 |
|
| 1984 |
Mansour AN, Sayers DE, Cook JW, Short DR, Shannon RD, Katzer JR. X-ray absorption studies of some platinum oxides Journal of Physical Chemistry. 88: 1778-1781. DOI: 10.1002/Chin.198431010 |
0.335 |
|
| 1983 |
Paesler MA, Sayers DE, Tsu R, Gonzalez-Hernandez J. Ordering of amorphous germanium prior to crystallization Physical Review B. 28: 4550-4557. DOI: 10.1103/Physrevb.28.4550 |
0.371 |
|
| 1983 |
Sayers DE, Heald SM, Pick MA, Budnick JI, Stern EA, Wong J. X-ray beam line at the NSLS for X-ray absorption studies in material science Nuclear Instruments and Methods in Physics Research. 208: 631-635. DOI: 10.1016/0167-5087(83)91196-1 |
0.356 |
|
| 1983 |
Short DR, Mansour AN, Cook JW, Sayers DE, Katzer JR. X-Ray absorption edge and extended x-ray absorption fine structure studies of Pt TiO2 catalysts Journal of Catalysis. 82: 299-312. DOI: 10.1016/0021-9517(83)90196-3 |
0.318 |
|
| 1981 |
Cook JW, Sayers DE. Criteria for automatic x-ray absorption fine structure background removal Journal of Applied Physics. 52: 5024-5031. DOI: 10.1063/1.329444 |
0.349 |
|
| 1980 |
Morawitz H, Bagus P, Clarke T, Gill W, Grant P, Street GB, Sayers D. X-ray absorption in polymers☆ Synthetic Metals. 1: 267-278. DOI: 10.1016/0379-6779(80)90016-8 |
0.383 |
|
| 1977 |
Crozier ED, Lytle FW, Sayers DE, Stern EA. Structural determinations of liquid semiconductors using extended X-ray absorption fine structure Canadian Journal of Chemistry. 55: 1968-1974. DOI: 10.1139/V77-274 |
0.403 |
|
| 1977 |
Stern EA, Sayers DE, Dash JG, Shechter H, Bunker B. Adsorbate and substrate characterization using extended X-ray absorption fine structure Physical Review Letters. 38: 767-770. DOI: 10.1103/Physrevlett.38.767 |
0.398 |
|
| 1977 |
Lytle FW, Sayers DE, Stern EA. Determination of s and d contributions to the L2,3 extended x-ray absorption fine structure Physical Review B. 15: 2426-2428. DOI: 10.1103/Physrevb.15.2426 |
0.34 |
|
| 1977 |
CROZIER ED, LYTLE FW, SAYERS DE, STERN EA. ChemInform Abstract: STRUCTURAL DETERMINATIONS OF LIQUID SEMICONDUCTORS USING EXTENDED X-RAY ABSORPTION FINE STRUCTURE Chemischer Informationsdienst. 8: no-no. DOI: 10.1002/Chin.197740003 |
0.368 |
|
| 1976 |
Stern EA, Sayers DE, Lytle FW. Orientational dependence of the Ta L3 edge absorption in 1T-TaS2 as measured by polarized x rays Physical Review Letters. 37: 298-301. DOI: 10.1103/Physrevlett.37.298 |
0.338 |
|
| 1975 |
Stern EA, Sayers DE, Lytle FW. Extended x-ray-absorption fine-structure technique. III. Determination of physical parameters Physical Review B. 11: 4836-4846. DOI: 10.1103/Physrevb.11.4836 |
0.352 |
|
| 1975 |
Lytle FW, Sayers DE, Stern EA. Extended x-ray-absorption fine-structure technique. II. Experimental practice and selected results Physical Review B. 11: 4825-4835. DOI: 10.1103/Physrevb.11.4825 |
0.375 |
|
| 1975 |
Sayers DE, Lytle FW, Weissbluth M, Pianetta P. A short range probe for investigating metalloprotein structures: Fourier analysis of the extended x-ray absorption fine structure The Journal of Chemical Physics. 2514-2515. DOI: 10.1063/1.430740 |
0.385 |
|
| 1974 |
Lytle FW, Sayers DE, Moore EB. Structure of catalysts: Determination by EPR and Fourier analysis of the extended x-ray absorption fine structure Applied Physics Letters. 24: 45-47. DOI: 10.1063/1.1655087 |
0.33 |
|
| 1973 |
Stern EA, Sayers DE. Shielding of impurities as measured by extended x-ray-absorption fine structure Physical Review Letters. 30: 174-177. DOI: 10.1103/Physrevlett.30.174 |
0.363 |
|
| 1973 |
Lytle FW, Sayers DE, Eikum AK. Calorimetric, diffraction and microscopic examination of evaporated amorphous germanium Journal of Non-Crystalline Solids. 13: 69-79. DOI: 10.1016/0022-3093(73)90036-7 |
0.313 |
|
| 1972 |
Sayers DE, Lytle FW, Stern EA. Structure determination of amorphous Ge, GeO2 and GeSe by fourier analysis of extended x-ray absorption fine structure (EXAFS) Journal of Non-Crystalline Solids. 8: 401-407. DOI: 10.1016/0022-3093(72)90167-6 |
0.344 |
|
| 1971 |
Sayers DE, Stern EA, Lytle FW. New technique for investigating noncrystalline structures: Fourier analysis of the extended x-ray-absorption fine structure Physical Review Letters. 27: 1204-1207. DOI: 10.1103/Physrevlett.27.1204 |
0.382 |
|
| 1969 |
Sayers DE, Lytle FW, Stern EA. Point Scattering Theory of X-Ray K-Absorbtion Fine Structure Advances in X-Ray Analysis. 13: 248-271. DOI: 10.1154/S0376030800011381 |
0.311 |
|
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