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Taechung Yi - Publications

Affiliations: 
2000 University of California, Los Angeles, Los Angeles, CA 
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2 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2000 Yi T, Li L, Kim C. Microscale material testing of single crystalline silicon: process effects on surface morphology and tensile strength Sensors and Actuators a-Physical. 83: 172-178. DOI: 10.1016/S0924-4247(00)00350-2  0.423
1999 Yi T, Kim CJ. Measurement of mechanical properties for MEMS materials Measurement Science and Technology. 10: 706-716. DOI: 10.1088/0957-0233/10/8/305  0.365
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