Ozgenc Ebil, Ph.D.
Affiliations: | 2005 | University of Delaware, Newark, DE, United States |
Area:
Materials Science Engineering, EnergyGoogle:
"Ozgenc Ebil"Parents
Sign in to add mentor| Robert W. Birkmire | grad student | 2005 | University of Delaware | |
| (Deposition and characterization of silicon thin-films by aluminum-induced crystallization.) | ||||
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Publications
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| Karabıyık M, Cihanoğlu G, Ebil Ö. (2023) CVD Deposited Epoxy Copolymers as Protective Coatings for Optical Surfaces. Polymers. 15 |
| Zablocki MJ, Sharkawy AS, Ebil O, et al. (2010) Nanomembrane enabled nanophotonic devices Proceedings of Spie - the International Society For Optical Engineering. 7606 |
| Ebil O, Aparicio R, Birkmire R. (2010) Aluminum-induced crystallization of amorphous silicon films deposited by hot wire chemical vapor deposition on glass substrates Thin Solid Films. 519: 178-183 |
| Ebil O, Aparicio R, Birkmire R. (2004) In-Situ Aluminum-Induced Crystallization of Si Thin-Films on Glass Substrates above the Eutectic Temperature using HW-CVD Mrs Proceedings. 808 |
| Ebil O, Aparicio R, Birkmire R. (2004) In-situ aluminum-induced crystallization of Si thin-films on glass substrates above the eutectic temperature using HW-CVD Materials Research Society Symposium Proceedings. 808: 321-326 |
| Ebil O, Aparicio R, Hazra S, et al. (2003) Deposition and structural characterization of poly-Si thin films on Al-coated glass substrates using hot-wire chemical vapor deposition Thin Solid Films. 430: 120-124 |