Justin R. Kirschbrown, Ph.D. - Publications

Affiliations: 
2013 Materials Science University of North Carolina, Chapel Hill, Chapel Hill, NC 
Area:
Ultrafast Spectroscopy of Nanomaterials and Interfaces

12 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Gabriel MM, Grumstrup EM, Kirschbrown JR, Pinion CW, Christesen JD, Zigler DF, Cating EE, Cahoon JF, Papanikolas JM. Imaging charge separation and carrier recombination in nanowire p-i-n junctions using ultrafast microscopy. Nano Letters. 14: 3079-87. PMID 24867088 DOI: 10.1021/Nl5012118  0.658
2014 Grumstrup EM, Gabriel MM, Cating EM, Pinion CW, Christesen JD, Kirschbrown JR, Vallorz EL, Cahoon JF, Papanikolas JM. Ultrafast carrier dynamics in individual silicon nanowires: Characterization of diameter-dependent carrier lifetime and surface recombination with pump-probe microscopy Journal of Physical Chemistry C. 118: 8634-8640. DOI: 10.1021/Jp502737E  0.728
2014 Grumstrup EM, Cating EM, Gabriel MM, Pinion CW, Christesen JD, Kirschbrown JR, Vallorz EL, Cahoon JF, Papanikolas JM. Ultrafast carrier dynamics of silicon nanowire ensembles: The impact of geometrical heterogeneity on charge carrier lifetime Journal of Physical Chemistry C. 118: 8626-8633. DOI: 10.1021/Jp501079B  0.705
2014 Gabriel MM, Grumstrup EM, Kirschbrown JR, Pinion CW, Christesen JD, Zigler DF, Cating EEM, Cahoon JF, Papanikolas JM. Visualization of charge carrier motion in semiconductor nanowires with ultrafast pump-probe microscopy Optics Infobase Conference Papers. DOI: 10.1007/978-3-319-13242-6_165  0.577
2013 Gabriel MM, Kirschbrown JR, Christesen JD, Pinion CW, Zigler DF, Grumstrup EM, Mehl BP, Cating EE, Cahoon JF, Papanikolas JM. Direct imaging of free carrier and trap carrier motion in silicon nanowires by spatially-separated femtosecond pump-probe microscopy. Nano Letters. 13: 1336-40. PMID 23421654 DOI: 10.1021/Nl400265B  0.783
2013 Mehl BP, Kirschbrown JR, Gabriel MM, House RL, Papanikolas JM. Pump-probe microscopy: spatially resolved carrier dynamics in ZnO rods and the influence of optical cavity resonator modes. The Journal of Physical Chemistry. B. 117: 4390-8. PMID 23092237 DOI: 10.1021/Jp307089H  0.778
2013 Kirschbrown JR, House RL, Mehl BP, Parker JK, Papanikolas JM. Hybrid standing wave and whispering gallery modes in needle-shaped ZnO rods: Simulation of emission microscopy images using finite difference frequency domain methods with a focused Gaussian source Journal of Physical Chemistry C. 117: 10653-10660. DOI: 10.1021/Jp4011907  0.739
2011 Mehl BP, Kirschbrown JR, House RL, Papanikolas JM. The end is different than the middle: Spatially dependent dynamics in ZnO rods observed by femtosecond pump-probe microscopy Journal of Physical Chemistry Letters. 2: 1777-1781. DOI: 10.1021/Jz200809C  0.764
2011 House RL, Kirschbrown JR, Mehl BP, Gabriel MM, Puccio JA, Parker JK, Papanikolas JM. Characterizing electron-hole plasma dynamics at different points in individual ZnO rods Journal of Physical Chemistry C. 115: 21436-21442. DOI: 10.1021/Jp207830H  0.768
2011 House RL, Mehl BP, Kirschbrown JR, Barnes SC, Papanikolas JM. Characterizing the ultrafast charge carrier trapping dynamics in single ZnO rods using two-photon emission microscopy Journal of Physical Chemistry C. 115: 10806-10816. DOI: 10.1021/Jp1118426  0.752
2010 Mehl BP, House RL, Uppal A, Reams AJ, Zhang C, Kirschbrown JR, Papanikolas JM. Direct imaging of optical cavity modes in ZnO rods using second harmonic generation microscopy. The Journal of Physical Chemistry. A. 114: 1241-6. PMID 19588988 DOI: 10.1021/Jp9009614  0.75
2009 House RL, Mehl BP, Zhang C, Kirschbrown JR, Barnes SC, Papanikolas JM. Investigation of ultrafast carrier dynamics in ZnO rods using two-photon emission and second harmonic generation microscopy Proceedings of Spie - the International Society For Optical Engineering. 7396. DOI: 10.1117/12.826064  0.776
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