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Chih-Hsiang Ho, Ph.D. - Publications

Affiliations: 
2014 Electrical and Computer Engineering Purdue University, West Lafayette, IN, United States 
Area:
Electronics and Electrical Engineering
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19 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2017 Lee S, Youn K, Jeong WS, Ho CT, Jun M. Protective Effects of Red Ginseng Oil against Aβ25-35-Induced Neuronal Apoptosis and Inflammation in PC12 Cells. International Journal of Molecular Sciences. 18. PMID 29065557 DOI: 10.3390/ijms18102218  0.378
2017 Youn K, Yu Y, Lee J, Jeong WS, Ho CT, Jun M. Polymethoxyflavones: Novel β-Secretase (BACE1) Inhibitors from Citrus Peels. Nutrients. 9. PMID 28869548 DOI: 10.3390/nu9090973  0.327
2017 Ho C, Tsai D, Lu C, Kim SY, Mungan S, Yang S, Zhang Y, He J. Device Process and Circuit Application Interaction for Harsh Electronics: Hf–In–Zn–O Thin Film Transistors as an Example Ieee Electron Device Letters. 38: 1039-1042. DOI: 10.1109/Led.2017.2720186  0.398
2016 Youn K, Park JH, Lee J, Jeong WS, Ho CT, Jun M. The Identification of Biochanin A as a Potent and Selective β-Site App-Cleaving Enzyme 1 (Bace1) Inhibitor. Nutrients. 8. PMID 27754406 DOI: 10.3390/Nu8100637  0.345
2016 Youn K, Lee S, Jeong WS, Ho CT, Jun M. Protective Role of Corilagin on Aβ25-35-Induced Neurotoxicity: Suppression of NF-κB Signaling Pathway. Journal of Medicinal Food. PMID 27654707 DOI: 10.1089/Jmf.2016.3714  0.38
2016 Ho CH, Kim SY, Panagopoulos GD, Roy K. Statistical TDDB Degradation in Memory Circuits: Bit-Cells to Arrays Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2016.2557279  0.71
2016 Mungan ES, Lu C, Ho CH, Roy K. Effects of deposition process on poly-Si microscale energy harvesting systems: A simulation study Ieee Transactions On Electron Devices. 63: 1650-1657. DOI: 10.1109/Ted.2016.2535275  0.51
2015 Wang Y, Tsai ML, Chiou LY, Pan MH, Ho CT. Antitumor activity of garcinol in human prostate cancer cells and xenograft mice. Journal of Agricultural and Food Chemistry. PMID 26442822 DOI: 10.1021/Acs.Jafc.5B03851  0.535
2015 Panagopoulos G, Ho C, Kim SY, Roy K. Physics-Based Compact Modeling of Successive Breakdown in Ultrathin Oxides Ieee Transactions On Nanotechnology. 14: 7-9. DOI: 10.1109/Tnano.2014.2366379  0.71
2015 Ho CH, Jenkins KA, Ainspan H, Ray E, Linder BP, Song P. Performance Degradation Analysis and Hot-Carrier Injection Impact on the Lifetime Prediction of LC Voltage Control Oscillator Ieee Transactions On Electron Devices. DOI: 10.1109/Ted.2015.2436905  0.39
2015 Ho C, Kim SY, Roy K. Ultra-thin dielectric breakdown in devices and circuits: A brief review Microelectronics Reliability. 55: 308-317. DOI: 10.1016/J.Microrel.2014.10.019  0.568
2014 Hassan MK, Ho CH, Roy K. Stochastic modeling of positive bias temperature instability in high-metal gate nMOSFETs Ieee Transactions On Electron Devices. 61: 2243-2249. DOI: 10.1109/Ted.2014.2321064  0.586
2014 Kim SY, Ho C, Roy K. Statistical SBD Modeling and Characterization and Its Impact on SRAM Cells Ieee Transactions On Electron Devices. 61: 54-59. DOI: 10.1109/Ted.2013.2292060  0.607
2014 Ho CH, Hassan MK, Kim SY, Roy K. Analysis of stability degradation of SRAMs using a physics-based PBTI model Ieee Electron Device Letters. 35: 951-953. DOI: 10.1109/Led.2014.2340373  0.543
2014 Ho C, Lu C, Roy K. An Enhanced Voltage Programming Pixel Circuit for Compensating GB-Induced Variations in Poly-Si TFTs for AMOLED Displays Ieee\/Osa Journal of Display Technology. 10: 345-351. DOI: 10.1109/Jdt.2014.2301020  0.533
2014 Retamal JRD, Kang C, Ho C, Ke J, Chang W, He J. Effect of ultraviolet illumination on metal oxide resistive memory Applied Physics Letters. 105: 253111. DOI: 10.1063/1.4904396  0.316
2013 Ho C, Panagopoulos G, Roy K. A Self-Consistent Electrothermal Model for Analyzing NBTI Effect in p-Type Poly-Si Thin-Film Transistors Ieee Transactions On Electron Devices. 60: 288-294. DOI: 10.1109/Ted.2012.2228657  0.701
2012 Ho C, Panagopoulos G, Roy K. A Physical Model for Grain-Boundary-Induced Threshold Voltage Variation in Polysilicon Thin-Film Transistors Ieee Transactions On Electron Devices. 59: 2396-2402. DOI: 10.1109/Ted.2012.2205387  0.711
2011 Chiang Y, Chang W, Ho C, Chen C, Ho C, Lin S, Wu T, He J. Single-ZnO-Nanowire Memory Ieee Transactions On Electron Devices. 58: 1735-1740. DOI: 10.1109/Ted.2011.2121914  0.322
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