Year |
Citation |
Score |
2019 |
Lee J, Oh H, Park CH, Youn BD, Han B. Test Scheme and Degradation Model of Accumulated Electrostatic Discharge (ESD) Damage for Insulated Gate Bipolar Transistor (IGBT) Prognostics Ieee Transactions On Device and Materials Reliability. 19: 233-241. DOI: 10.1109/Tdmr.2019.2898920 |
0.31 |
|
2019 |
Oh H, Choi H, Jung JH, Youn BD. A robust and convex metric for unconstrained optimization in statistical model calibration—probability residual (PR) Structural and Multidisciplinary Optimization. 60: 1171-1187. DOI: 10.1007/S00158-019-02288-6 |
0.307 |
|
2017 |
Kim DW, Oh H, Youn BD, Kwon D. Bivariate Lifetime Model for Organic Light-Emitting Diodes Ieee Transactions On Industrial Electronics. 64: 2325-2334. DOI: 10.1109/Tie.2016.2623584 |
0.321 |
|
2016 |
Kim T, Oh H, Kim H, Youn BD. An Online-Applicable Model for Predicting Health Degradation of PEM Fuel Cells With Root Cause Analysis Ieee Transactions On Industrial Electronics. 63: 7094-7103. DOI: 10.1109/Tie.2016.2586022 |
0.311 |
|
2016 |
Oh H, Wei HP, Han B, Youn BD. Probabilistic Lifetime Prediction of Electronic Packages Using Advanced Uncertainty Propagation Analysis and Model Calibration Ieee Transactions On Components, Packaging and Manufacturing Technology. DOI: 10.1109/Tcpmt.2015.2510398 |
0.339 |
|
2016 |
Oh H, Kim J, Son H, Youn BD, Jung BC. A systematic approach for model refinement considering blind and recognized uncertainties in engineered product development Structural and Multidisciplinary Optimization. 54: 1527-1541. DOI: 10.1007/S00158-016-1493-3 |
0.317 |
|
2015 |
Oh H, Choi S, Kim K, Youn BD, Pecht M. An empirical model to describe performance degradation for warranty abuse detection in portable electronics Reliability Engineering and System Safety. 142: 92-99. DOI: 10.1016/J.Ress.2015.04.019 |
0.445 |
|
2015 |
Jung BC, Park J, Oh H, Kim J, Youn BD. A framework of model validation and virtual product qualification with limited experimental data based on statistical inference Structural and Multidisciplinary Optimization. 51: 573-583. DOI: 10.1007/S00158-014-1155-2 |
0.305 |
|
2014 |
Oh H, Azarian MH, Morillo C, Pecht M, Rhem E. Failure mechanisms of ball bearings under lightly loaded, non-accelerated usage conditions Tribology International. 81: 291-299. DOI: 10.1016/J.Triboint.2014.09.014 |
0.415 |
|
2013 |
Oh H, Azarian MH, Das D, Pecht M. A critique of the IPC-9591 standard: Performance parameters for air moving devices Ieee Transactions On Device and Materials Reliability. 13: 146-155. DOI: 10.1109/Tdmr.2012.2223820 |
0.427 |
|
2012 |
Oh H, Shibutani T, Pecht M. Precursor monitoring approach for reliability assessment of cooling fans Journal of Intelligent Manufacturing. 23: 173-178. DOI: 10.1007/S10845-009-0342-2 |
0.431 |
|
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