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Vikash Ranjan, Ph.D. - Publications

Affiliations: 
2011 Physics and Astronomy The University of Toledo 
Area:
Condensed Matter Physics
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22 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Ashrafee T, Aryal K, Rajan G, Karki S, Ranjan V, Rockett A, Collins RW, Ayala O, Marsillac S. Effect of substrate temperature on sputtered molybdenum film as a back contact for Cu(In,Ga)Se2 solar cells 2015 Ieee 42nd Photovoltaic Specialist Conference, Pvsc 2015. DOI: 10.1109/PVSC.2015.7355907  0.422
2014 Aryal K, Rajan G, Ashrafee T, Ranjan V, Aryal P, Rockett A, Collins RW, Marsillac S. Real time spectroscopic ellipsometry studies of ultrathin CIGS films deposited by 1-stage, 2-stage and 3-stage co-evaporation processes 2014 Ieee 40th Photovoltaic Specialist Conference, Pvsc 2014. 318-322. DOI: 10.1109/PVSC.2014.6924922  0.313
2014 Aryal K, Rajan G, Ashrafee T, Ranjan V, Li J, Rockett A, Collins RW, Marsillac S. Effect of selenium evaporation rate on ultrathin Cu(In,Ga)Se2 films 2014 Ieee 40th Photovoltaic Specialist Conference, Pvsc 2014. 314-317. DOI: 10.1109/PVSC.2014.6924921  0.499
2014 Aryal P, Pradhan P, Attygalle D, Ibdah ARA, Aryal K, Ranjan V, Marsillac S, Podraza NJ, Collins RW. Real-time, in-line, and mapping spectroscopic ellipsometry for applications in Cu(In1-xGax)Se2 metrology Ieee Journal of Photovoltaics. 4: 333-339. DOI: 10.1109/Jphotov.2013.2282745  0.68
2014 Ranjan V, Begou T, Little S, Collins RW, Marsillac S. Non-destructive optical analysis of band gap profile, crystalline phase, and grain size for Cu(In,Ga)Se2 solar cells deposited by 1-stage, 2-stage, and 3-stage co-evaporation Progress in Photovoltaics: Research and Applications. 22: 77-82. DOI: 10.1002/Pip.2350  0.681
2013 Attygalle D, Ranjan V, Aryal P, Pradhan P, Marsillac S, Podraza NJ, Collins RW. Optical monitoring and control of three-stage coevaporated Cu(In 1-x Gax)Se 2 by real-time spectroscopic ellipsometry Ieee Journal of Photovoltaics. 3: 375-380. DOI: 10.1109/Jphotov.2012.2220122  0.705
2012 Aryal K, Rajan G, Erkaya Y, Hegde N, Boland P, Ranjan V, Collins RW, Marsillac S. Characterization of TCO deposition for CIGS solar cells Conference Record of the Ieee Photovoltaic Specialists Conference. 2018-2020. DOI: 10.1109/PVSC.2012.6317994  0.336
2012 Little SA, Ranjan V, Begou T, Collins RW, Marsillac S. In situ real time spectroscopic ellipsometry analysis of Ag nanoparticle layers for back contact reflector applications Conference Record of the Ieee Photovoltaic Specialists Conference. 2006-2008. DOI: 10.1109/PVSC.2012.6317991  0.51
2012 Little S, Ranjan V, Collins RW, Marsillac S. Analysis of (Ag,Cu)(In,Ga)Se2 solar cells deposited by a hybrid process Conference Record of the Ieee Photovoltaic Specialists Conference. 884-886. DOI: 10.1109/PVSC.2012.6317743  0.454
2012 Ranjan V, Aryal K, Little S, Erkaya Y, Rajan G, Boland P, Attygalle D, Aryal P, Pradhan P, Collins RW, Marsillac S. Real time analysis of ultra-thin CIGS thin film deposition Conference Record of the Ieee Photovoltaic Specialists Conference. 452-454. DOI: 10.1109/PVSC.2012.6317655  0.379
2012 Erkaya Y, Hegde N, Aryal K, Rajan G, Boland P, Ranjan V, Baumgart H, Collins RW, Marsillac S. Characterization of ZnS films deposited by ALD for CIGS solar cells Conference Record of the Ieee Photovoltaic Specialists Conference. 383-384. DOI: 10.1109/PVSC.2012.6317612  0.326
2012 Little SA, Ranjan V, Collins RW, Marsillac S. Growth analysis of (Ag,Cu)InSe2 thin films via real time spectroscopic ellipsometry Applied Physics Letters. 101. DOI: 10.1063/1.4769902  0.72
2012 Ranjan V, Collins RW, Marsillac S. Real-time analysis of the microstructural evolution and optical properties of Cu(In,Ga)Se 2 thin films as a function of Cu content Physica Status Solidi - Rapid Research Letters. 6: 10-12. DOI: 10.1002/Pssr.201105385  0.734
2012 Attygalle D, Ranjan V, Aryal P, Pradhan P, Marsillac S, Podraza NJ, Collins RW. Optical monitoring and control of three-stage coevaporated Cu(In 1-xGax)Se2 by real-time spectroscopic ellipsometry Conference Record of the Ieee Photovoltaic Specialists Conference.  0.438
2011 Begou T, Little SA, Aquino A, Ranjan V, Rockett A, Collins RW, Marsillac S. In situ and ex situ characterization of (Ag, Cu)InSe 2 thin films Conference Record of the Ieee Photovoltaic Specialists Conference. 000326-000328. DOI: 10.1109/PVSC.2011.6185920  0.677
2011 Begou T, Walker JD, Attygalle D, Ranjan V, Collins RW, Marsillac S. Real time spectroscopic ellipsometry of CuInSe 2: Growth dynamics, dielectric function, and its dependence on temperature Physica Status Solidi - Rapid Research Letters. 5: 217-219. DOI: 10.1002/Pssr.201105204  0.584
2010 Marsillac S, Ranjan V, Little S, Collins RW. IN-situ study of CIGS dielectric function as a function of copper content Conference Record of the Ieee Photovoltaic Specialists Conference. 866-868. DOI: 10.1109/PVSC.2010.5617166  0.517
2010 Walker JD, Khatri H, Little S, Ranjan V, Collins R, Marsillac S. Optical and physical characterization of Cu2-xSe thin films for real time spectroscopic ellipsometry on Cu(In,Ga)Se2-based photovoltaic devices Materials Research Society Symposium Proceedings. 1210: 159-164.  0.545
2009 Walker JD, Khatri H, Little S, Ranjan V, Collins R, Marsillac S. Optical and Physical Characterization of Cu 2-x Se Thin Films for Real Time Spectroscopic Ellipsometry on Cu(In,Ga)Se 2 -based Photovoltaic Devices Mrs Proceedings. 1210. DOI: 10.1557/Proc-1210-Q06-02  0.716
2009 Walker JD, Khatri H, Ranjan V, Little S, Zartman R, Collins RW, Marsitlac S. Dielectric functions and growth dynamics of Culn1-x,GA xSE2 absorber layers via in situ real time spectroscopic ellipsometry Conference Record of the Ieee Photovoltaic Specialists Conference. 001154-001156. DOI: 10.1109/PVSC.2009.5411223  0.38
2009 Walker JD, Khatri H, Ranjan V, Li J, Collins RW, Marsillac S. Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry Applied Physics Letters. 94. DOI: 10.1063/1.3117222  0.67
2008 Khatri H, Walker JD, Li J, Ranjan V, Khanal RR, Collins RW, Marsillac S. In situ and ex situ characterization of molybdenum thin films Conference Record of the Ieee Photovoltaic Specialists Conference. DOI: 10.1109/PVSC.2008.4922480  0.362
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