Zhiyu Liu - Publications

Affiliations: 
2008 Electrical and Computer Engineering University of Wisconsin, Madison, Madison, WI 
 2008- Broadcom Corporation 

17 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Makarim S, Sprintall J, Liu Z, Yu W, Santoso A, Yan XH, Susanto RD. Previously unidentified Indonesian Throughflow pathways and freshening in the Indian Ocean during recent decades. Scientific Reports. 9: 7364. PMID 31089167 DOI: 10.1038/S41598-019-43841-Z  0.305
2019 Liu C, Wang X, Köhl A, Wang F, Liu Z. The Northeast‐Southwest Oscillating Equatorial Mode of the Tropical Instability Wave and Its Impact on Equatorial Mixing Geophysical Research Letters. 46: 218-225. DOI: 10.1029/2018Gl080226  0.328
2017 Lin H, Hu J, Liu Z, Belkin IM, Sun Z, Zhu J. A peculiar lens-shaped structure observed in the South China Sea. Scientific Reports. 7: 478. PMID 28352077 DOI: 10.1038/S41598-017-00593-Y  0.305
2017 Liu Z, Lian Q, Zhang F, Wang L, Li M, Bai X, Wang J, Wang F. Weak Thermocline Mixing in the North Pacific Low-Latitude Western Boundary Current System Geophysical Research Letters. 44: 10,530-10,539. DOI: 10.1002/2017Gl075210  0.328
2016 Liu C, Köhl A, Liu Z, Wang F, Stammer D. Deep-reaching thermocline mixing in the equatorial pacific cold tongue. Nature Communications. 7: 11576. PMID 27175988 DOI: 10.1038/Ncomms11576  0.317
2015 Wu K, Dai M, Chen J, Meng F, Li X, Liu Z, Du C, Gan J. Dissolved organic carbon in the South China Sea and its exchange with the Western Pacific Ocean Deep-Sea Research Part Ii: Topical Studies in Oceanography. 122: 41-51. DOI: 10.1016/J.Dsr2.2015.06.013  0.302
2015 Lian Q, Liu Z. Turbulence and mixing in a freshwater-influenced tidal bay: Observations and numerical modeling Science China-Earth Sciences. 58: 2049-2058. DOI: 10.1007/S11430-015-5093-7  0.315
2013 Lozovatsky I, Liu Z, Fernando HJS, Hu J, Wei H. The TKE dissipation rate in the northern South China Sea Ocean Dynamics. 63: 1189-1201. DOI: 10.1007/S10236-013-0656-7  0.336
2012 Lozovatsky I, Liu Z, Fernando H, Armengol J, Roget E. Shallow water tidal currents in close proximity to the seafloor and boundary-induced turbulence Ocean Dynamics. 62: 177-191. DOI: 10.1007/S10236-011-0495-3  0.334
2009 Liu Z, Wei H, Lozovatsky ID, Fernando HJS. Late summer stratification, internal waves, and turbulence in the Yellow Sea Journal of Marine Systems. 77: 459-472. DOI: 10.1016/J.Jmarsys.2008.11.001  0.332
2008 Liu Z, Kursun V. Characterization of a novel nine-transistor SRAM cell Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 16: 488-492. DOI: 10.1109/Tvlsi.2007.915499  0.545
2008 Lozovatsky I, Liu Z, Wei H, Fernando HJS. Tides and mixing in the northwestern East China Sea, Part II: Near-bottom turbulence Continental Shelf Research. 28: 338-350. DOI: 10.1016/J.Csr.2007.08.007  0.31
2008 Lozovatsky I, Liu Z, Wei H, Fernando HJS. Tides and mixing in the northwestern East China Sea Part I: Rotating and reversing tidal flows Continental Shelf Research. 28: 318-337. DOI: 10.1016/J.Csr.2007.08.006  0.318
2007 Liu Z, Kursun V. PMOS-only sleep switch dual-threshold voltage domino logic in sub-65-nm CMOS technologies Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 15: 1311-1319. DOI: 10.1109/Tvlsi.2007.903947  0.573
2006 Liu Z, Kursun V. Leakage biased pMOS sleep switch dynamic circuits Ieee Transactions On Circuits and Systems Ii: Express Briefs. 53: 1093-1097. DOI: 10.1109/Tcsii.2006.882206  0.568
2006 Liu Z, Kursun V. Leakage power characteristics of dynamic circuits in nanometer CMOS technologies Ieee Transactions On Circuits and Systems Ii: Express Briefs. 53: 692-696. DOI: 10.1109/Tcsii.2006.876463  0.564
2006 Liu Z, Kursun V. Sleep switch dual threshold voltage domino logic with reduced subthreshold and gate oxide leakage current Microelectronics Journal. 37: 812-820. DOI: 10.1016/J.Mejo.2006.01.001  0.57
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