Markus Brink, Ph.D. - Publications

Affiliations: 
2007 Cornell University, Ithaca, NY, United States 
Area:
Condensed Matter Physics

9 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2017 Abdo B, Brink M, Chow JM. Gyrator Operation Using Josephson Mixers Physical Review Applied. 8. DOI: 10.1103/Physrevapplied.8.034009  0.378
2017 Abdo B, Chavez-Garcia JM, Brink M, Keefe G, Chow JM. Time-multiplexed amplification in a hybrid-less and coil-less Josephson parametric converter Applied Physics Letters. 110: 082601. DOI: 10.1063/1.4976962  0.367
2014 Brink M, Lauer I, Engelmann SU, Majumdar A, Cohen SA, Kratschmer E, Guillorn MA. Contamination mitigation of hydrogen silsesquioxane resist processed with Na+-containing developer for nanoscale CMOS device patterning Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 32. DOI: 10.1116/1.4867653  0.372
2008 Zhu J, Brink M, McEuen PL. Single-electron force readout of nanoparticle electrometers attached to carbon nanotubes. Nano Letters. 8: 2399-404. PMID 18578552 DOI: 10.1021/Nl801295Y  0.359
2005 Bunch JS, Yaish Y, Brink M, Bolotin K, McEuen PL. Coulomb oscillations and Hall effect in quasi-2D graphite quantum dots. Nano Letters. 5: 287-90. PMID 15794612 DOI: 10.1021/Nl048111+  0.402
2005 Zhu J, Brink M, McEuen PL. Frequency shift imaging of quantum dots with single-electron resolution Applied Physics Letters. 87: 1-3. DOI: 10.1063/1.2139623  0.354
2004 Yaish Y, Park JY, Rosenblatt S, Sazonova V, Brink M, McEuen PL. Electrical nanoprobing of semiconducting carbon nanotubes using an atomic force microscope. Physical Review Letters. 92: 046401. PMID 14995390 DOI: 10.1103/Physrevlett.92.046401  0.405
2002 Javey A, Kim H, Brink M, Wang Q, Ural A, Guo J, McIntyre P, McEuen P, Lundstrom M, Dai H. High-kappa dielectrics for advanced carbon-nanotube transistors and logic gates. Nature Materials. 1: 241-6. PMID 12618786 DOI: 10.1038/Nmat769  0.401
2002 Park JY, Yaish Y, Brink M, Rosenblatt S, McEuen PL. Electrical cutting and nicking of carbon nanotubes using an atomic force microscope Applied Physics Letters. 80: 4446-4448. DOI: 10.1063/1.1485126  0.423
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