John C. Bean - Publications
Affiliations: | 1997 | Materials Science Research | Bell Laboratories, Murray Hill, NJ, United States |
1997- | Engineering & Applied Science | University of Virginia, Charlottesville, VA |
Area:
Materials ScienceWebsite:
https://wecanfigurethisout.org/ABOUT/About.php#:~:text=I%20went%20south,in%20Applied%20PhysicsYear | Citation | Score | |||
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1998 | Stach EA, Hull R, Bean JC, Jones KS, Nejim A. In Situ Studies of the Interaction of Dislocations with Point Defects during Annealing of Ion Implanted Si/SiGe/Si (001) Heterostructures. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 4: 294-307. PMID 9767667 DOI: 10.1017/S1431927698980308 | 0.019 | |||
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