Cynthia Volkert

Affiliations: 
Georg-August-Universität Göttingen, Göttingen, Niedersachsen, Germany 
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"Cynthia Volkert"
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Zhang GP, Volkert CA, Schwaiger R, et al. (2006) Length-scale-controlled fatigue mechanisms in thin copper films Acta Materialia. 54: 3127-3139
Nucci J, Krämer S, Arzt E, et al. (2005) Local Strains Measured in Al Lines During Thermal Cycling and Electromigration Using Convergent-beam Electron Diffraction Journal of Materials Research. 20: 1851-1859
Zhang GP, Volkert CA, Schwaiger R, et al. (2005) Damage behavior of 200-nm thin copper films under cyclic loading Journal of Materials Research. 20: 201-207
Zhang GP, Schwaiger R, Volkert CA, et al. (2003) Effect of film thickness and grain size on fatigue-induced dislocation structures in Cu thin films Philosophical Magazine Letters. 83: 477-483
Witt C, Volkert CA, Arzt E. (2003) Electromigration-induced Cu motion and precipitation in bamboo Al–Cu interconnects Acta Materialia. 51: 49-60
Nucci JA, Straub A, Bischoff E, et al. (2002) Growth of electromigration-induced hillocks in Al interconnects Journal of Materials Research. 17: 2727-2735
Böhm J, Volkert CA, Mönig R, et al. (2002) Electromigration-induced damage in bamboo al interconnects Journal of Electronic Materials. 31: 45-49
Dekker JP, Volkert CA, Arzt E, et al. (2001) Alloying effects on electromigration mass transport. Physical Review Letters. 87: 035901
Volkert CA, Lingk C. (1998) Effect of compression on grain growth in Al films Applied Physics Letters. 73: 3677-3679
Volkert C, Alofs C, Liefting J. (1994) Deformation mechanisms of Al films on oxidized Si wafers Journal of Materials Research. 9: 1147-1155
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