Year |
Citation |
Score |
2017 |
Chen W, Ray S, Bhadra J, Abadir M, Wang L. Challenges and Trends in Modern SoC Design Verification Ieee Design & Test of Computers. 34: 7-22. DOI: 10.1109/Mdat.2017.2735383 |
0.311 |
|
2017 |
Abadir M, Bhadra J, Chen W, Wang L. Guest Editors’ Introduction: Emerging Challenges and Solutions in SoC Verification Ieee Design & Test of Computers. 34: 5-6. DOI: 10.1109/Mdat.2017.2729938 |
0.352 |
|
2013 |
Bastani P, Callegari N, Wang L, Abadir MS. Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained Ieee Design & Test of Computers. 1-1. DOI: 10.1109/Mdt.2009.130 |
0.661 |
|
2013 |
Ray S, Bhadra J, Abadir MS, Wang LC. Guest Editorial: Test and verification challenges for future microprocessors and SoC designs Journal of Electronic Testing: Theory and Applications (Jetta). 29: 621-623. DOI: 10.1007/S10836-013-5411-Y |
0.403 |
|
2010 |
Guzey O, Wang LC, Levitt JR, Foster H. Increasing the efficiency of simulation-based functional verification through unsupervised support vector analysis Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 29: 138-148. DOI: 10.1109/Tcad.2009.2034347 |
0.669 |
|
2010 |
Bastani P, Callegari N, Wang LC, Abadir MS. Feature-ranking methodology to diagnose design-silicon timing mismatch Ieee Design and Test of Computers. 27: 42-52. DOI: 10.1109/Mdt.2009.95 |
0.682 |
|
2008 |
Ong C, Hong D, Cheng K, Wang L. A Clock-Less Jitter Spectral Analysis Technique Ieee Transactions On Circuits and Systems. 55: 2263-2272. DOI: 10.1109/Tcsi.2008.918235 |
0.605 |
|
2005 |
Feng T, Wang L, Cheng K(, Lin C(. Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator Acm Transactions On Design Automation of Electronic Systems. 10: 627-650. DOI: 10.1145/1109118.1109122 |
0.643 |
|
2003 |
Wang L, Feng T, Cheng K(, Abadir MS, Pandey M. Enhanced Symbolic Simulation for Functional Verification of Embedded Array Systems Design Automation For Embedded Systems. 8: 173-188. DOI: 10.1023/B:Daem.0000003961.86651.2B |
0.664 |
|
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