Aaron M. Kueck, Ph.D. - Publications
Affiliations: | 2009 | University of California, Berkeley, Berkeley, CA, United States |
Area:
Materials Science EngineeringYear | Citation | Score | |||
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2010 | Kueck AM, Ramasse QM, De Jonghe LC, Ritchie RO. Atomic-scale imaging and the effect of yttrium on the fracture toughness of silicon carbide ceramics Acta Materialia. 58: 2999-3005. DOI: 10.1016/J.Actamat.2010.01.031 | 0.492 | |||
2008 | Kueck AM, Kim do K, Ramasse QM, De Jonghe LC, Ritchie RO. Atomic-resolution imaging of the nanoscale origin of toughness in rare-earth doped SiC. Nano Letters. 8: 2935-9. PMID 18702553 DOI: 10.1021/Nl8017884 | 0.342 | |||
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